51. Resonant magnetic scattering of polarized X-rays at the Mn 2p edge from Mn0.06Ge0.94 diluted magnetic semiconductor
- Author
-
O. Heckmann, C. Spezzani, C. Quaresima, K. Hricovini, Bruno Olivieri, P. Perfetti, J.-M. Mariot, Amina Taleb-Ibrahimi, Nicola Zema, M.C. Richter, C. Grazioli, P. De Padova, Dino Fiorani, and A.M. Testa
- Subjects
Condensed matter physics ,Chemistry ,Scattering ,Metals and Alloys ,Surfaces and Interfaces ,Magnetic semiconductor ,Atmospheric temperature range ,Surfaces, Coatings and Films ,Electronic, Optical and Magnetic Materials ,law.invention ,Nanoclusters ,SQUID ,Condensed Matter::Materials Science ,Magnetization ,Ferromagnetism ,law ,Materials Chemistry ,Thin film - Abstract
We present expressions for the resonant magnetic X-ray scattering (XRMS) by surfaces possessing roughness and analyze both the structural and magnetic roughness of a surface, as well as their correlation. We demonstrate that the leading contribution to the difference (DI) in the diffuse scattering between left- and right-circularly polarized light for a rough surface vanishes unless the structural and magnetic roughnesses are correlated, to leading order in the magnetization. The effects of magnetic domain structure and magnetic dead layers on the surface scattering are also discussed.
- Published
- 2008