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85 results on '"Alimov, V.Kh."'

51. In-vessel surface layer evolution during plasma–wall interaction in the Globus-M spherical tokamak

Author

Gusev, V.K., primary, Alimov, V.Kh., additional, Arkhipov, I.I., additional, Ber, B.Ya., additional, Gorodetsky, A.E., additional, Khromov, N.A., additional, Kurdumov, A.A., additional, Lebedev, V.M., additional, Litunovsky, N.V., additional, Mazul, I.V., additional, Nikolaev, Yu.A., additional, Novokhatsky, A.N., additional, Petrov, Yu.V., additional, Sakharov, N.V., additional, Terukov, E.I., additional, Trapeznikova, I.N., additional, Zakharov, A.P., additional, and Zalavutdinov, R.Kh., additional

Published
2009
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53. Recrystallized graphite behavior as the first wall material in Globus-M spherical tokamak

Author

Gusev, V.K., primary, Alimov, V.Kh., additional, Arkhipov, I.I., additional, Balden, M., additional, Denisov, E.A., additional, Gorodetsky, A.E., additional, Kurdumov, A.A., additional, Kompaniec, T.N., additional, Lebedev, V.M., additional, Litunovsky, N.V., additional, Mazul, I.V., additional, Novokhatsky, A.N., additional, Petrov, Yu.V., additional, Sakharov, N.V., additional, Sharapov, V.M., additional, Terukov, E.I., additional, Trapeznikova, I.N., additional, Roth, J., additional, Zakharov, A.P., additional, and Zalavutdinov, R.Kh., additional

Published
2009
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71. Characterization of a-B/C: H films deposited from different boron containing precursors

Author

Alimov, V.Kh., primary, Bogomolov, D.B., additional, Churaeva, M.N., additional, Gorodetsky, A.E., additional, Kanashenko, S.L., additional, Kanaev, A.I., additional, Rybakov, S.Yu., additional, Sharapov, V.M., additional, Zakharov, A.P., additional, Zalavutdinov, R.Kh., additional, Buzhinsky, O.I., additional, Chernobay, A.P., additional, Grashin, S.A., additional, Mirnov, S.V., additional, Bregadze, V.I., additional, and Usyatinsky, A.Yu., additional

Published
1992
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77. Differential cross-section of the D(3He,p)4He nuclear reaction and depth profiling of deuterium up to large depths

Author

Alimov, V.Kh., Mayer, M., and Roth, J.

Subjects
*DEUTERIUM, *HYDROGEN isotopes, *PROTONS, *ATOMS
Abstract

Abstract: The differential D(3He,p)4He reaction cross-section was determined at a laboratory angle of 135° for 3He energies between 0.5 and 6MeV. Deuterium depth profiles are determined from the measurement of the proton yield as a function of incident 3He energy with following deconvolution of the obtained yield function. This allows deuterium depth profiling to very large depths. Deuterium depth profiling to a depth of 7μm in W and 50μm in B4C is demonstrated. The accuracy of the method is discussed. [Copyright &y& Elsevier]

Published
2005
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78. Deuterium retention in beryllium surface layer in contact with atomic deuterium

Author

Sharapov, V.M., Gavrilov, L.E., and Alimov, V.Kh.

Abstract

AbstractThe interaction of deuterium atoms with beryllium TIP-30 at 740 K was studied. A plasma source with heated cathode was used to produce deuterium atoms. A positive potentials was applied to the beryllium sample during D atoms exposure to screen in from positive D ions. After D atom exposure for 1 and 4 hours the depth distributions of deuterium atoms and molecules in Be were measured using combined SIMS and RGA methods. It has been shown that deuterium is retained in Be both in atomie and in molecular forms. Oxide film grows on the beryllium surface during the D atom exposure and BeO thickness correlates with deuterium distribution. The retained deuterium is mainly located in the oxide layer. It is suggested that the gas fllled bubbles and cavities which are formed in grown oxide layer are the traps for molecular deuterium. A high concentration of D atoms in the near-surface layers is attributed to the chemical bonding of D atoms to BeO oxide with beryllium hydroxide formation.

Published
1998
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80. The effect of displacement damage on deuterium retention in tungsten exposed to D neutrals and D2 gas.

Author

Alimov, V.Kh., Hatano, Y., Sugiyama, K., Roth, J., Tyburska-Püschel, B., Dorner, J., Shi, J., Matsuyama, M., Isobe, K., and Yamanishi, T.

Subjects
*DEUTERIUM, *TUNGSTEN ions, *POLYCRYSTALS, *TEMPERATURE effect, *NUCLEAR reactions
Abstract

Abstract: Samples of polycrystalline ITER-grade W and recrystallized W were irradiated at room temperature with 20MeV W ions to displacement damage up to 0.5dpa. The damaged W samples were then exposed to (i) D neutrals at 403–573K and (ii) D2 gas at 673–1073K and pressures of 1.2 and 100kPa. Trapping of deuterium in the damage zone was examined by the D(3He, p)4He nuclear reaction with 3He energies between 0.69 and 4.0MeV allowing determination of the D concentration up to a depth of 6μm. It has been found that generation of the W-ion-induced displacement damage leads to accumulation of deuterium in the damage zone up to concentration depending on the exposure temperature and, at temperatures ⩾673K, on the D2 gas pressure. Thermal desorption spectra allowed a conclusion that deuterium is mainly accumulated in the form of D atoms bound to inner walls of vacancy clusters. [Copyright &y& Elsevier]

Published
2013
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84. Deuterium retention in single-crystal tungsten irradiated with 10–500 eV/D+.

Author

Roszell, J.P., Davis, J.W., Alimov, V.Kh., Sugiyama, K., and Haasz, A.A.

Subjects
*DEUTERIUM ions, *SINGLE crystals, *TUNGSTEN, *SPECTRUM analysis, *RADIATION, *THERMAL desorption, *TEMPERATURE effect
Abstract

Abstract: Deuterium retention in single-crystal tungsten was measured by thermal desorption spectroscopy as a function of D+ energy, fluence and specimen temperature. At 300K, D retention increased significantly with increasing ion energy but at 500K the energy dependence was weak. For both 300 and 500K implantations, the retention was significantly lower for 10eV/D+ than for 500eV/D+ over the fluence range ∼1022–1024 D/m2. Depth profiles in D-implanted SCW show D retention at 300K extending beyond 7μm while at 500K retention concentration is detectable at the surface <60nm. By comparison, D retention of 10eV/D+ at both 300 and 500K is detectable in the very near surface. Similar TDS release peaks for both 10 and 500eV/D+ indicate that trapping mechanisms are independent of incident ion energy, and the reduced D retention is likely to be due to the shallower trapping depth. [Copyright &y& Elsevier]

Published
2013
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85. Deuterium depth profiling in JT-60U tiles using the D(3He,p)4He resonant nuclear reaction

Author

Hayashi, T., Sugiyama, K., Krieger, K., Mayer, M., Alimov, V.Kh., Tanabe, T., Masaki, K., and Miya, N.

Subjects
*NUCLEAR reactions, *DEUTERIUM, *HYDROGEN, *ISOTOPES
Abstract

Abstract: Deuterium depth profiles in graphite tiles of JT-60U have been determined by means of the D(3He,p)4He nuclear reaction. Tiles with net carbon deposition showed high deuterium retention. A D/C ratio of 0.07 was found in the outer dome wing tile. In the inner divertor tile covered with a thick deposition layer, the depth profile shows a broad peak in a deep region. This indicates that deuterium trapped in the shallow region can be replaced by hydrogen with hydrogen discharges due to isotope exchange, while deuterium trapped in the deeper region can not. Deuterium in the redeposited layers can be more easily removed than that in the substrate. The deuterium concentration in the outer divertor target tile was very low (D/C<0.003). The highest D/C ratio, 0.09, was found in the upper region of the first wall. [Copyright &y& Elsevier]

Published
2007
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