51. Silicon nanowire based radio-frequency spectrum analyser
- Author
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Christelle Monat, Mark Pelusi, Bill Corcoran, Benjamin J. Eggleton, Rubin Ma, David J. Moss, Tony Vo, Siegfried Janz, Adam Densmore, and D.-X. Xu
- Subjects
Spectrum analyzer ,3D optical data storage ,Materials science ,Silicon ,business.industry ,Cross-phase modulation ,Bandwidth (signal processing) ,Analyser ,Optical communication ,Nanophotonics ,Nanowire ,Physics::Optics ,chemistry.chemical_element ,Radio spectrum ,Optics ,chemistry ,Dispersion (optics) ,Radio frequency ,business - Abstract
We demonstrate a silicon nanowire based radio frequency spectrum analyser based on cross-phase modulation. We show that the device is accurate, with cross-chirp from photogenerated free-carriers negligible and measure RF spectra for 640Gbaud on-off-keyed data., 2010 36th European Conference and Exhibition on Optical Communication, ECOC 2010, September 19-23, 2010, Torino, Italy
- Published
- 2010