451. Effect of shape resolution on the simulated energetic response of shock induced pore collapse within HMX.
- Author
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Mares, Jesus O., Hardin, D. Barrett, Butler, G. "Chip", Vitarelli, James P., Molek, Christopher D., Lane, J. Matthew D., Germann, Timothy C., Armstrong, Michael R., Wixom, Ryan, Damm, David, and Zaug, Joseph
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SCANNING electron microscopy ,MECHANICAL shock measurement - Abstract
It is widely accepted that the shock initiation of explosive materials is largely dependent upon the localization of energy at material defects commonly referred to as "hot-spots". Many studies have investigated the effect of size and distribution of the shock-induced collapse of voids within explosive materials. However, there is limited understanding of the effect of void shape on the collapse process and subsequent energy localization. In this work, complex Fourier descriptors were used to characterize a series of 2-dimensional void structures imaged via scanning electron microscopy of pressed HMX material. The shape information of the void structures was modified by a series of decreasing low-pass filters to yield increasingly "smoothed" void structures. The shock-induced collapse of these modified void structures was then simulated to investigate the effect of shape resolution. This methodology allows for the evaluation of spatial resolution needed to "adequately" characterize a void under shock loading. [ABSTRACT FROM AUTHOR]
- Published
- 2020
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