1. Electronic structure of delta-doped La:SrTiO3 layers by hard x-ray photoelectron spectroscopy.
- Author
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Kaiser, A. M., Gray, A. X., Conti, G., Jalan, B., Kajdos, A. P., Gloskovskii, A., Ueda, S., Yamashita, Y., Kobayashi, K., Drube, W., Stemmer, S., and Fadley, C. S.
- Subjects
ELECTRONIC structure ,MOLECULAR beam epitaxy ,ELASTIC scattering ,X-ray photoelectron spectroscopy ,SECONDARY ion mass spectrometry - Abstract
We have employed hard x-ray photoemission (HAXPES) to study a delta-doped SrTiO3 layer that consisted of a 3-nm thickness of La-doped SrTiO3 with 6% La embedded in a SrTiO3 film. Results are compared to a thick, uniformily doped La:SrTiO3 layer. We find no indication of a band offset for the delta-doped layer, but evidence of the presence of Ti3+ in both the thick sample and the delta-layer, and indications of a density of states increase near the Fermi energy in the delta-doped layer. These results further demonstrate that HAXPES is a powerful tool for the non-destructive investigation of deeply buried doped layers. [ABSTRACT FROM AUTHOR]
- Published
- 2012
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