1. A Chromosome-Scale Genome Assembly of a Helicoverpa zea Strain Resistant to Bacillus thuringiensis Cry1Ac Insecticidal Protein.
- Author
-
Stahlke, Amanda R, Chang, Jennifer, Tembrock, Luke R, Sim, Sheina B, Chudalayandi, Sivanandan, Geib, Scott M, Scheffler, Brian E, Perera, Omaththage P, Gilligan, Todd M, Childers, Anna K, Hackett, Kevin J, and Coates, Brad S
- Subjects
- *
HELIOTHIS zea , *BACILLUS thuringiensis , *HELICOVERPA armigera , *FALL armyworm , *MITOCHONDRIAL DNA , *INSECT pests , *ECOLOGICAL zones , *BT cotton - Abstract
Helicoverpa zea (Lepidoptera: Noctuidae) is an insect pest of major cultivated crops in North and South America. The species has adapted to different host plants and developed resistance to several insecticidal agents, including Bacillus thuringiensis (Bt) insecticidal proteins in transgenic cotton and maize. Helicoverpa zea populations persist year-round in tropical and subtropical regions, but seasonal migrations into temperate zones increase the geographic range of associated crop damage. To better understand the genetic basis of these physiological and ecological characteristics, we generated a high-quality chromosome-level assembly for a single H. zea male from Bt-resistant strain, HzStark_Cry1AcR. Hi-C data were used to scaffold an initial 375.2 Mb contig assembly into 30 autosomes and the Z sex chromosome (scaffold N50 = 12.8 Mb and L50 = 14). The scaffolded assembly was error-corrected with a novel pipeline, polishCLR. The mitochondrial genome was assembled through an improved pipeline and annotated. Assessment of this genome assembly indicated 98.8% of the Lepidopteran Benchmark Universal Single-Copy Ortholog set were complete (98.5% as complete single copy). Repetitive elements comprised approximately 29.5% of the assembly with the plurality (11.2%) classified as retroelements. This chromosome-scale reference assembly for H. zea , ilHelZeax1.1, will facilitate future research to evaluate and enhance sustainable crop production practices. [ABSTRACT FROM AUTHOR]
- Published
- 2023
- Full Text
- View/download PDF