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A new experimental geometry for simultaneously mapping the rocking curves of a sample over a one- or two-dimensional array of points on the sample has been developed. The 422 asymmetric diffraction of Cu Kα[sub 1] radiation with a monolithic channel-cut silicon crystal angularly collimates and spatially expands the x-ray beam. A cooled Reticon linear photodiode array with 25-µm spatial resolution was used for the one-dimensional detector. Compared with the commonly used double-crystal diffractometer method, more information can be obtained from the present method, for example, characterization of the minute local misorientation of subgrains and the precise determination of the curvature of a crystal. The uniformity of the crystal quality and the local variation of the curvature of the crystal planes over a sample can also be revealed from the contour map of the rocking curves. Maps of the roeldng curves of several samples have been collected using this method. [ABSTRACT FROM AUTHOR]