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High resolution synchrotron tomography has demonstrated a proportionality between electromigration induced void volume and time-to-failure in hybrid bonding based test structures. A conventional failure by voiding in long feed lines was observed. Process induced bonding voids do not affect reliability of the analyzed samples. [ABSTRACT FROM AUTHOR]

The first practical application of X-rays, more than 100 years ago, was for biomedical imaging. Although not central to the initial development of 3rd generation synchrotron light sources, imaging techniques have today established themselves as a core element of the research program at all major light sources, including the ESRF, where X-ray imaging has been identified as one of five main themes for its Upgrade Programme [1]. [ABSTRACT FROM AUTHOR]

Abstract: Modern synchrotron radiation (SR) sources have dramatically fostered the use of SR-based X-ray imaging. The relevant information such as density, chemical composition, chemical states, structure, and crystallographic perfection is mapped in two, or, increasingly, in three dimensions. The development of nano-science requires pushing spatial resolution down towards the nanoscale. The present article describes a selection of hard X-ray imaging and microanalysis techniques that emerged over the last few years, by taking advantage of the flux and coherence of the SR beams, as well as exploiting the advances in X-ray optics and detectors, and the increased possibilities of computers (memory, speed). Examples are given to illustrate the opportunities associated with the use of these techniques, and a number of recent references are provided. To cite this article: J. Baruchel et al., C. R. Physique 9 (2008). [Copyright &y& Elsevier]

Proposes an adapted fan volume sampling scheme for a linear tomosynthesis system. Reconstruction process when the X-ray source translates along a finite straight line; Overview of the limited angle problem; Algebraic reconstruction methods and regularization; Details of the testing of the algorithm using experimental projections.

To fabricate and qualify nanodevices, characterization tools must be developed to provide a large panel of information over spatial scales spanning from the millimeter down to the nanometer. Synchrotron x-ray-based tomography techniques are getting increasing interest since they can provide fully three-dimensional (3D) images of morphology, elemental distribution, and crystallinity of a sample. Here we show that by combining suitable scanning schemes together with high brilliance x-ray nanobeams, such multispectral 3D volumes can be obtained during a single analysis in a very efficient and nondestructive way. We also show that, unlike other techniques, hard x-ray nanotomography allows reconstructing the elemental distribution over a wide range of atomic number and offers truly depth resolution capabilities. The sensitivity, 3D resolution, and complementarity of our approach make hard x-ray nanotomography an essential characterization tool for a large panel of scientific domains. [ABSTRACT FROM AUTHOR]

A hard x-ray nanoprobe has been implemented at the synchrotron in Grenoble, France, allowing nondestructive trace element imaging of thick samples. Its advantages are nanometer spatial resolution on samples of several tens of micrometer, very high flux, and achromaticity. Nanometer imaging of a cometary grain from the NASA Stardust mission shows the sensitivity and resolution gains obtained while radically changing our understanding of the composition of heterogeneous samples. The probe opens unique possibilities in the study of minute, fragile samples fundamental to the earth and planetary sciences, which until now were out of the reach of direct analytical methods. [ABSTRACT FROM AUTHOR]

A nondestructive x-ray technique combining simultaneous transmission, fluorescence, and Compton microtomography has been developed. Simultaneous three-dimensional structural information and three-dimensional internal elemental composition maps down to trace concentration levels have been obtained by a helical scan of the sample through an x-ray microbeam. With this method quantitative three-dimensional chemical distributions can be obtained at (sub)micrometric resolution in a nondestructive and noninvasive way, opening unique possibilities for the microanalysis of rare and fragile samples from several research fields. © 2004 American Institute of Physics. [ABSTRACT FROM AUTHOR]