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In multilayers of magnetic thin films with perpendicular anisotropy, domain walls can take on hybrid configurations in the vertical direction which minimize the domain wall energy, with Néel walls in the top or bottom layers and Bloch walls in some central layers. These types of textures are theoretically predicted, but their observation has remained challenging until recently, with only a few techniques capable of realizing a three dimensional characterization of their magnetization distribution. Here we perform a field dependent X-ray resonant magnetic scattering measurements on magnetic multilayers exploiting circular dichroism contrast to investigate such structures. Using a combination of micromagnetic and X-ray resonant magnetic scattering simulations along with our experimental results, we characterize the three-dimensional magnetic texture of domain walls, notably the thickness resolved characterization of the size and position of the Bloch part in hybrid walls. We also take a step in advancing the resonant scattering methodology by using measurements performed off the multilayer Bragg angle in order to calibrate the effective absorption of the X-rays, and permitting a quantitative evaluation of the out of plane (z) structure of our samples. Beyond hybrid domain walls, this approach can be used to characterize other periodic chiral structures such as skyrmions, antiskyrmions or even magnetic bobbers or hopfions, in both static and dynamic experiments. [ABSTRACT FROM AUTHOR]

In this work, we take a step toward nanometer resolution magnetic tomography, demonstrating the use of resonant magnetic x-ray scattering for three-dimensional (3D) characterization of Co/Pd multilayers. Trading coherence for x-ray flux, we measured magnetic scattering out to full period resolutions of 20 nm for incidence angles up to 75° from normal incidence, which was sufficient for a semiquantitative analysis of the 3D magnetic domain structure of such films. For the analysis of such patterns, we developed a scattering model based upon multiple plane propagation of the beam through the sample, taking into account the effects of multiple scattering not accounted for with Born or Rytov approximation based models. Our results demonstrate that 3D statistical characterization of nanoscale magnetic features is currently possible, and it is expected that the advent of high brilliance sources such as MAX IV in Sweden and SIRIUS in Brazil will provide the coherent flux necessary to permit the generalization of this work to nanometer resolution magnetic tomography. [ABSTRACT FROM AUTHOR]