1. Inelastic relaxation in Gd-doped ceria films: Micro-Raman spectroscopy.
- Author
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Kraynis, Olga, Wachtel, Ellen, Lubomirsky, Igor, and Livneh, Tsachi
- Subjects
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INELASTIC scattering , *DOPING agents (Chemistry) , *CERIUM oxides , *RAMAN spectroscopy , *SPUTTERING (Physics) , *X-ray diffraction - Abstract
Micro-Raman spectroscopy and X-ray diffraction were used to study time-dependent structural changes in sputtered Ce 1-x Gd x O 2-x/2 films. The F 2 g peak position was measured at five well-defined film locations; X-ray diffraction assessed in-plane compressive strain and unit cell volume. For x = 0.05, at all locations monitored post-annealing, the F 2 g frequency continued to increase during two weeks and for x = 0.10, at 4 of 5 locations during six weeks. This time-dependent behavior is attributed to relaxation of local elastic dipolar strain fields. Raman spectroscopy can properly evaluate strain in thin films of these materials only when mechanical properties, defect structure, temporal and thermal history are considered. [ABSTRACT FROM AUTHOR]
- Published
- 2017
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