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Your search keyword '"Witters, Liesbeth"' showing total 5 results

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5 results on '"Witters, Liesbeth"'

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1. Low-Frequency Noise Assessment of Different Ge pFinFET STI Processes.

2. GR-Noise Characterization of Ge pFinFETs With STI First and STI Last Processes.

3. SiGe Channel Technology: Superior Reliability Toward Ultra-Thin EOT Devices—Part II: Time-Dependent Variability in Nanoscaled Devices and Other Reliability Issues.

4. Buried Silicon-Germanium pMOSFETs: Experimental Analysis in VLSI Logic Circuits Under Aggressive Voltage Scaling.

5. Layout Scaling of \Si1-x\Gex \-Channel pFETs.

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