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1. Rectifying characteristic of perovskite oxide La1.89Ce0.11CuO4/Ba0.5Sr0.5TiO3/La0.67Sr0.33MnO3 heterostructures.

2. TRANSPORT PROPERTIES OF ELECTRON-DOPED La2−xCexCuO4 THIN FILM IN THE UNDER-DOPED REGION.

3. Microwave Study of FeSe0.3Te0.7 Thin Film by TE011-Mode Sapphire Dielectric Resonator.

4. Crystal orientation dependence of the dielectric properties for epitaxial BaZr0.15Ti0.85O3 thin films.

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