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The present review places emphasis on a comprehensive survey of experimental techniques to probe the structural and morphological features at the nanoscale range in thin magnetic films, incorporating those available at in-house laboratories as well as those at state-of-the-art synchrotron radiation facilities. This elucidating the range of available techniques, and the information they can yield represents a step for advancing the understanding of and for unlocking new possibilities in the design and optimization of thin magnetic films across a wide range of applications. [ABSTRACT FROM AUTHOR]

Large area manufacturing processes of thin films such as large-area vacuum roll-to-roll coating of dielectric and gas permeation barrier layers in industry require a precise control of e.g. film thickness, homogeneity, chemical compositions, crystallinity and surface roughness. In order to determine these properties in real time, hyperspectral imaging is a novel, cost-efficient, and fast tool as in-line technology for large-area quality control. We demonstrate the application of hyperspectral imaging to characterize the thickness of thin films of the multilayer system ZTO/Ag/ITO produced by roll-to-roll magnetron sputtering on 220 mm wide polyethylene terephthalate substrate. X-ray reflectivity measurements are used to determine the thickness gradients of roll-to-roll produced foils with sub nanometer accuracy that serve as ground truth data to train a machine learning model for the interpretation of the hyperspectral imaging spectra. Based on the model, the sub-layer thicknesses on the complete substrate foil area were predicted which demonstrates the capabilities of this approach for large-scale in-line real-time quality control for industrial applications. [ABSTRACT FROM AUTHOR]

A carbon–carbon-linked, ultrathin, two-dimensional (2D) polymer film was prepared at the air/water interface through photochemically triggered [2 + 2] cycloaddition. The preorganization of the monomers on the water surface and the subsequent photo-polymerization led to the successful preparation of the ultrathin 2D polymer film. The obtained film is continuous, free standing, and has a large area (over 50 μm2). Transmission electron microscopy (TEM) and atomic force microscopy (AFM) give clear evidence of the ultrathin film morphology. Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) indicate successful photo-induced [2 + 2] polymerization. [ABSTRACT FROM AUTHOR]

The mesogen orientations of liquid crystals are sensitive to the nature of the contacting surface. For side chain liquid crystalline polymer (SCLCP) films, most investigations have been conducted for thin films formed on a solid substrate surface such as glass, quartz and metal oxides, and little knowledge has been accumulated for SCLCP films whose top surface is covered by amorphous polymers. This work presents the effect of a topcoat with amorphous polymers placed on SCLCP films on the mesogen orientation and photoalignment behavior. When an SCLCP film that adopts a homeotropic mesogen orientation is covered with a glass plate or polymer layer, the mesogens turns to a random planar orientation. This planar orientation is favorable for efficient in-plane photoalignment by irradiation with linear polarized light. An in-plane order parameter exceeding 0.5 is readily obtained. Unexpectedly, a significant stabilization of the liquid crystal phase by over 10 °C is observed above the isotropization temperature of the SCLCP. These fundamental sets of knowledge should be significant in the fabrication of various polymer LC devices. [ABSTRACT FROM AUTHOR]

While the crystal structure of the polymorph phase can be studied in three dimensions conveniently by X‐ray methods like grazing‐incidence X‐ray diffraction (GIXD), the first monolayer is only accessible by surface‐sensitive methods that allow the determination of a two‐dimensional lattice. Here, GIXD measurements with sample rotation are compared with distortion‐corrected low‐energy electron diffraction (LEED) experiments on conjugated molecules: 3,4;9,10‐perylenetetracarboxylic dianhydride (PTCDA), 6,13‐pentacenequinone (P2O), 1,2;8,9‐dibenzopentacene (trans‐DBPen) and dicyanovinyl‐quaterthiophene (DCV4T‐Et2) grown by physical vapor deposition on Ag(111) and Cu(111) single crystals. For these molecular crystals, which exhibit different crystallographic lattices and crystal orientations as well as epitaxial properties, the geometric parameters of the three‐dimensional lattice are compared with the corresponding geometry of the first monolayer. A comparison of the monolayer lattice from LEED investigations with the multilayer lattices determined by rotated GIXD experiments reveals a correlation between the first monolayer and the epitaxial growth of three‐dimensional crystals together with lattice distortions and re‐alignment of molecules. The selected examples show three possible scenarios of crystal growth on top of an ordered monolayer: (i) growth of a single polymorph, (ii) growth of three different polymorphs; in both cases the first monolayer serves as template. In the third case (iii) strong lattice distortion and distinct molecular re‐alignments from the monolayer to epitaxially grown crystals are observed. This is the second part of our work concerning the correlation between two‐ and three‐dimensional crystallographic lattices for epitaxial analysis. In the first part, the theoretical basis has been derived which provides a mathematical relationship between the six lattice parameters of the three‐dimensional case and the three parameters obtained for the two‐dimensional surface unit cell, together with their orientation to the single‐crystalline substrate. In this work, a combined experimental approach of GIXD and LEED is introduced which can be used to investigate the effect of the epitaxial monolayer on the structural properties of molecular crystals grown on top. [ABSTRACT FROM AUTHOR]

In this review, the technique of resonant soft X-ray reflectivity in the study of magnetic low-dimensional systems is discussed. This technique is particularly appealing in the study of magnetization at buried interfaces and to discriminate single elemental contributions to magnetism, even when this is ascribed to few atoms. The major fields of application are described, including magnetic proximity effects, thin films of transition metals and related oxides, and exchange-bias systems. The fundamental theoretical background leading to dichroism effects in reflectivity is also briefly outlined. [ABSTRACT FROM AUTHOR]

Here, we report on adding an important dimension to the fundamental understanding of the evolution of the thin film micro structure evolution. Thin films have gained broad attention in their applications for electro-optical devices, solar-cell technology, as well storage devices. Deep insights into fundamental functionalities can be realized via studying crystallization microstructure and formation processes of polycrystalline or epitaxial thin films. Besides the fundamental aspects, it is industrially important to minimize cost which intrinsically requires lower energy consumption at increasing performance which requires new approaches to thin film growth in general. Here, we present a state of the art sputtering technique that allows for time-resolved in situ studies of such thin film growth with a special focus on the crystallization via small angle scattering and X-ray diffraction. Focusing on the crystallization of the example material of BaTiO 3 , we demonstrate how a prototypical thin film forms and how detailed all phases of the structural evolution can be identified. The technique is shaped to enable a versatile approach for understanding and ultimately controlling a broad variety of growth processes, and more over it demonstrate how to in situ investigate the influence of single high temperature sputtering parameters on the film quality. It is shown that the whole evolution from nucleation, diffusion adsorption and grain growth to the crystallization can be observed during all stages of thin film growth as well as quantitatively as qualitatively. This can be used to optimize thin-film quality, efficiency and performance. [ABSTRACT FROM AUTHOR]

Copolyesterurethanes (PDLCLs) based on oligo(ε‐caprolactone) (OCL) and oligo(ω‐pentadecalactone) (OPDL) segments are biodegradable thermoplastic temperature‐memory polymers. The temperature‐memory capability in these polymers with crystallizable control units is implemented by a thermomechanical programming process causing alterations in the crystallite arrangement and chain organization. These morphological changes can potentially affect degradation. Initial observations on the macroscopic level inspire the hypothesis that switching of the controlling units causes an accelerated degradation of the material, resulting in programmable degradation by sequential coupling of functions. Hence, detailed degradation studies on Langmuir films of a PDLCL with 40 wt% OPDL content are carried out under enzymatic catalysis. The temperature‐memory creation procedure is mimicked by compression at different temperatures. The evolution of the chain organization and mechanical properties during the degradation process is investigated by means of polarization‐modulated infrared reflection absorption spectroscopy, interfacial rheology and to some extend by X‐ray reflectivity. The experiments on PDLCL Langmuir films imply that degradability is not enhanced by thermal switching, as the former depends on the temperature during cold programming. Nevertheless, the thin film experiments show that the leaching of OCL segments does not induce further crystallization of the OPDL segments, which is beneficial for a controlled and predictable degradation. [ABSTRACT FROM AUTHOR]

A universal thermostatic chamber has been designed for X-ray scattering studies of various types of adsorption layers at air–water and oil–water interfaces. The camera can be used both on a laboratory diffractometer with a horizontal arrangement of a sample and a mobile emitter–detector system, as well as in a specialized spectrometer on a synchrotron radiation source. [ABSTRACT FROM AUTHOR]

Three series of ionic self-assembled materials based on anionic azo-dyes and cationic benzalkonium surfactants were synthesized and thin films were prepared by spin-casting. These thin films appear isotropic when investigated with polarized optical microscopy, although they are highly anisotropic. Here, three series of homologous materials were studied to rationalize this observation. Investigating thin films of ordered molecular materials relies to a large extent on advanced experimental methods and large research infrastructure. A statement that in particular is true for thin films with nanoscopic order, where X-ray reflectometry, X-ray and neutron scattering, electron microscopy and atom force microscopy (AFM) has to be used to elucidate film morphology and the underlying molecular structure. Here, the thin films were investigated using AFM, optical microscopy and polarized absorption spectroscopy. It was shown that by using numerical method for treating the polarized absorption spectroscopy data, the molecular structure can be elucidated. Further, it was shown that polarized optical spectroscopy is a general tool that allows determination of the molecular order in thin films. Finally, it was found that full control of thermal history and rigorous control of the ionic self-assembly conditions are required to reproducibly make these materials of high nanoscopic order. Similarly, the conditions for spin-casting are shown to be determining for the overall thin film morphology, while molecular order is maintained. [ABSTRACT FROM AUTHOR]

A method is proposed to estimate (using the autocorrelation function (ACF)) the thickness of layers determining the electron density profile of a thin film. The method does not require additional conditions and is applicable to an arbitrary reflectivity curve. It is based on the ACF synthesis by a superposition of Gaussians, whose parameters are related to the characteristics of the film layers and interfaces. The potential of this method is demonstrated by a number of model examples. [ABSTRACT FROM AUTHOR]

The proliferation of laser technologies has profoundly increased the demand for high-quality optical thin films whose physical properties are tunable and well defined. Such films are frequently deposited in thicknesses much shorter than the wavelengths of visible light and consequently present challenges for characterization by traditional microscopy. Metal films in particular exemplify these challenges, due to their broad range of refractive indices, optical absorption and often near-complete reflectivity in the visible spectrum. However, due to their relatively consistent crystalline structure, the bulk optical properties of metal thin films are chiefly dependent on their thickness. This review therefore presents a compendium of viable alternative characterization techniques to highlight their respective utilities, limitations and resolutions, specifically with regard to the characterization of the thickness of metal films. Furthermore, this review explicitly addresses the operating theories, methods and analyses relating to the five most predominantly utilized techniques: X-ray Reflectivity (XRR), Spectroscopic Ellipsometry (SE), Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM) and Energy-Dispersive X-ray Spectroscopy (EDS). This work is intended as an introductory guide to thin film characterization modalities and their applicability for metal and optically-absorptive films, while also identifying AFM and SEM/EDS as being amongst the more reliable of the techniques. [ABSTRACT FROM AUTHOR]

Optimizing the morphology of bulk heterojunctions is known to significantly improve the photovoltaic performance of organic solar cells, but available quantitative imaging techniques are few and have severe limitations. We demonstrate X-ray ptychographic coherent diffractive imaging applied to all-organic blends. Specifically, the phase-separated morphology in bulk heterojunction photoactive layers for organic solar cells, prepared from a 50:50 blend of poly(3-hexylthiophene) (P3HT) and phenyl-C61-butyric acid methyl ester (PCBM) and thermally treated for different annealing times is imaged to high resolution. Moreover, using a fast-scanning calorimetry chip setup, the nano-morphological changes caused by repeated thermal annealing applied to the same sample could be monitored. X-ray ptychography resolves to better than 100 nm the phase-segregated domains of electron donor and electron acceptor materials over a large field of view within the active layers. The quantitative phase contrast images further allow us to estimate the local volume fraction of PCBM across the photovoltaically active layers. The volume fraction gradient for different regions provides insight on the PCBM diffusion across the depletion zone surrounding PCBM aggregates. Phase contrast X-ray microscopy is under rapid development, and the results presented here are promising for future studies of organic-organic blends, also under in situ conditions, e.g., for monitoring the structural stability during UV-Vis irradiation. [ABSTRACT FROM AUTHOR]

Five hundred-nanometer-thick ZnO-based textured polycrystalline films consisting of 490-nm-thick Al-doped ZnO (AZO) films deposited on 10-nm-thick Ga-doped ZnO (GZO) films exhibited a high Hall mobility ( μ) of 50.1 cm/Vs with a carrier concentration ( N) of 2.55 × 10 cm. Firstly, the GZO films were prepared on glass substrates by ion plating with dc arc discharge, and the AZO films were then deposited on the GZO films by direct current magnetron sputtering (DC-MS). The GZO interface layers with a preferential c-axis orientation play a critical role in producing AZO films with texture development of a well-defined (0001) orientation, whereas 500-nm-thick AZO films deposited by only DC-MS showed a mixture of the c-plane and the other plane orientation, to exhibit a μ of 38.7 cm/Vs with an N of 2.22 × 10 cm. [ABSTRACT FROM AUTHOR]

Dynamical scattering effects are observed in grazing-incidence X-ray diffraction experiments using an organic thin film of 2,2':6',20"-ternaphthalene grown on oxidized silicon as substrate. Here, a splitting of all Bragg peaks in the out-ofplane direction (z-direction) has been observed, the magnitude of which depends both on the incidence angle of the primary beam and the out-of-plane angle of the scattered beam. The incident angle was varied between 0.09° and 0.25° for synchrotron radiation of 10.5 keV. This study reveals comparable intensities of the split peaks with a maximum for incidence angles close to the critical angle of total external reflection of the substrate. This observation is rationalized by two different scattering pathways resulting in diffraction peaks at different positions at the detector. In order to minimize the splitting, the data suggest either using incident angles well below the critical angle of total reflection or angles well above, which sufficiently attenuates the contributions from the second scattering path. This study highlights that the refraction of X-rays in (organic) thin films has to be corrected accordingly to allow for the determination of peak positions with sufficient accuracy. Based thereon, a reliable determination of the lattice constants becomes feasible, which is required for crystallographic structure solutions from thin films. [ABSTRACT FROM AUTHOR]

Investigations on the photoaglinment processes of liquid crystalline materials started around 25 years ago, and currently great developments have been made in both academic and industrial areas. However, there remain many issues to be explored in this field. This short review introduces our recent advances regarding the photoalignment and realignment process using azobenzene-containing liquid crystalline polymer materials. Two topics are involved here: the photoalignment of microphase separation structures of block copolymer films, and photoalignment controls from the free surface of a liquid crystalline polymer film. [ABSTRACT FROM PUBLISHER]

Novel X-ray imaging of structural domains in a ferroelectric epitaxial thin film using diffraction contrast is presented. The full-field hard X-ray microscope uses the surface scattering signal, in a reflectivity or diffraction experiment, to spatially resolve the local structure with 70 nm lateral spatial resolution and subnanometer height sensitivity. Sub-second X-ray exposures can be used to acquire a 14 mm 14 mm image with an effective pixel size of 20 nm on the sample. The optical configuration and various engineering considerations that are necessary to achieve optimal imaging resolution and contrast in this type of microscopy are discussed. [ABSTRACT FROM AUTHOR]

The hydrodynamic properties of free-standing smectic films close to a second order smectic-A (SmA) — nematic (N) phase transition are investigated. By using an extended McMillan model, the profiles of the smectic elastic constants are computed at different temperatures. We show that the amplitude of smectic fluctuations has a strong dependence on the film temperature. By considering the critical behavior of viscoelastic coefficients of thin films, we show that the typical underdamped relaxation of the smectic order is replaced by an overdamped behavior close to the bulk transition temperature. [ABSTRACT FROM AUTHOR]

Background subtraction practice in X-ray reflectivity reciprocal space mapping (XRRSM) is described and compared to the traditional specular reflectivity. XRRSM allows determining a more precise contribution of background to the reflectivity signal which manifests itself in an improvement of the resolution of interference fringes. Data analysis and influence of background subtraction determined by two methods on the structural parameters of thin film are discussed using simulated X-ray reflectivity. [ABSTRACT FROM AUTHOR]

X-rays investigations have been shown to reveal important information regarding material features and the formation mechanism of mesostructured materials. Small angle X-ray scattering (SAXS) analysis performed using a synchrotron source has been very important in the optimization of the organization of mesoporous coatings obtained by evaporation induced self-assembly (EISA). The interaction between X-rays and ordered mesoporous films has only recently been reported, and new knowledge has been developed to use this external radiation source to tune the local material properties. Here we discuss the recent developments in X-ray lithography combined with sol-gel synthesis to pattern mesostructured and hierarchical porous coatings including the ability to tailor functionalized surfaces. [ABSTRACT FROM AUTHOR]

When a two-dimensional (2D) film is compressed to its stability limit, it explores the third dimension via collapse. Understanding this 2D-to-3D transition is of great importance as it provides insight into the origin of defects in thin films. This review draws attention to a reversible folding collapse first discovered in model lung surfac- tant systems and explores the driving forces for this mechanism. The mode of collapse can be tuned by varying the mechanical properties of the film. I present a continuum elastic theory that captures the on- set of the observed folding instability and use digital image analysis to analyxe the folding dynamics. This article further explores factors that determine the maximum surface pressure a mixed monolayer can sustain and explains the observed phenomenon using the prin- ciple of rigidity percolation. The folding transition observed in lipid monolayers described here has also been observed in other systems, including monolayers of nanoparticles. [ABSTRACT FROM AUTHOR]

Data analysis methods for specular X-ray or neutron reflectivity are compared. The methods that have been developed over the years can be classified into different types. The so-called classical methods are based on Parrat's or Abelès' formalism and rely on minimization using more or less evolved Levenberg–Marquardt or simplex routines. A second class uses the same formalism, but optimization is carried out using simulated annealing or genetic algorithms. A third class uses alternative expressions for the reflectivity, such as the Born approximation or distorted Born approximation. This makes it easier to invert the specular data directly, coupled or not with classical least-squares or iterative methods using over-relaxation or charge-flipping techniques. A fourth class uses mathematical methods founded in scattering theory to determine the phase of the scattered waves, but has to be coupled in certain cases with (magnetic) reference layers. The strengths and weaknesses of a number of these methods are evaluated using simulated and experimental data. It is shown that genetic algorithms are by far superior to traditional and advanced least-squares methods, but that they fail when the layers are less well defined. In the latter case, the methods from the third or fourth class are the better choice, because they permit at least a first estimate of the density profile to be obtained that can be refined using the classical methods of the first class. It is also shown that different analysis programs may calculate different reflectivities for a similar chemical system. One reason for this is that the representation of the layers is either described by chemical composition or by scattering length or electronic densities, between which the conversion of the absorptive part is not straightforward. A second important reason is that routines that describe the convolution with the instrumental resolution function are not identical. [ABSTRACT FROM AUTHOR]

Data reduction practice in X-ray reflectometry is described. The several approaches for applying certain corrections, such as background subtraction, geometrical effects and normalization, are compared and discussed. Two widely employed setups, one with beam knife-edge and one without, are compared with respect to a number of corrections to be applied. [ABSTRACT FROM AUTHOR]

Grazing-incidence small-angle X-ray or neutron scattering of thin polymer films reveals information about the ordering and preferential orientations of the phase-separated microdomains within the films. The grazing-incidence geometry enhances the surface sensitivity; however, the scattering has to be treated within the framework of the distorted-wave Born approximation. In this work, the case of thin films with lamellar mesostructure is studied, where the orientation of the lamellae is either perpendicular or parallel to the film interfaces. For perpendicular lamellae, Bragg rods are found, which are extended along the film normal, whereas for parallel lamellae, peaks along the film normal appear. The positions of the maxima present in the latter case are explained by accounting for refraction at the film surface and reflection at the film–substrate interface. The results are relevant for thin films of lamellar diblock copolymers. [ABSTRACT FROM AUTHOR]

In this review article we discuss the thin film analytical techniques of interface sensitive X-ray and neutron scattering applied to aligned stacks of amphiphilic bilayers, in particular phospholipid membranes in the fluid Lα phase. We briefly discuss how the structure, composition, fluctuations and interactions in lipid or synthetic membranes can be studied by modern surface sensitive scattering techniques, using X-rays or neutrons as a probe. These techniques offer an in-situ approach to study lipid bilayer systems in different environments over length scales extending from micrometer to nanometer, both with and without additional membrane-active molecules such as amphiphilic peptides or membrane proteins. [ABSTRACT FROM AUTHOR]

The structures adopted by adsorbed thin films of Gay-Berne particles in the presence of a coexisting vapour phase are investigated by molecular dynamics simulation. The films are adsorbed at a flat substrate which favours planar anchoring, whereas the nematic-vapour interface favours normal alignment. On cooling, a system with a high molecule-substrate interaction strength exhibits substrate-induced planar orientational ordering and considerable stratification is observed in the density profiles. In contrast, a system with weak molecule-substrate coupling adopts a director orientation orthogonal to the substrate plane, owing to the increased influence of the nematic-vapour interface. There are significant differences between the structures adopted at the two interfaces, in contrast with the predictions of density functional treatments of such systems. [ABSTRACT FROM AUTHOR]

Thermal fluctuations of the smectic layers in freely suspended thin liquid crystalline films have been studied by the methods of X-ray diffraction and reflectometry. The fluctuation dynamics is studied by the methods of photon correlation spectroscopy with the use of a source of coherent synchrotron radiation. In freely suspended smectic films, the typical relaxation times are of the order of several microseconds. In thin liquid crystalline films, the simultaneous damped and oscillatory behavior was observed for the layer undulations. © 2001 MAIK “Nauka / Interperiodica”. [ABSTRACT FROM AUTHOR]

The analysis of x-ray reflectivity data from artificial heterostructures usually relies on the homogeneity of optical properties of the constituent materials. However, when the x-ray energy is tuned to the absorption edge of a particular resonant site, this assumption may no longer be appropriate. For samples realizing lattice planes with and without resonant sites, the corresponding regions containing the sites at resonance will have optical properties very different from regions without those sites. In this situation, models assuming homogeneous optical properties throughout the material can fail to describe the reflectivity adequately. As we show here, resonant soft x-ray reflectivity is sensitive to these variations, even though the wavelength is typically large as compared to the atomic distances over which the optical properties vary. We have therefore developed a scheme for analyzing resonant soft x-ray reflectivity data, which takes the atomic structure of a material into account by ‘slicing’ it into atomic planes with characteristic optical properties. Using LaSrMnO4 as an example, we discuss both the theoretical and experimental implications of this approach. Our analysis not only allows to determine important structural information such as interface terminations and stacking of atomic layers, but also enables to extract depth-resolved spectroscopic information with atomic resolution, thus enhancing the capability of the technique to study emergent phenomena at surfaces and interfaces. [ABSTRACT FROM AUTHOR]

Recently, magnetic nanocomposites (MNC) have aroused significant scientific and technological interests because their properties strongly rely on the interplay between those of the constituent components. Here, using three types of cobalt-based MNCs, we demonstrate how their physical behaviour, including thermal, electrical and magnetic, can be strongly affected by such interplays. First, using Aucore-Coshell nanoparticles (NPs), we demonstrate that their thermal stabilities are critically dependent on various boundaries and they structurally transform from the core-shells to the peanut structures via several intermediate states by a series of energy minimizations including the grain boundaries, Co/Au interface and strain. Second, the microstructures of the MNC are co-determined by the properties of the individual components, which in turn will strongly affect their overall properties. We illustrate this by a careful study of the electron transport in cobalt/poly (3-hexylthiophene, 2, 5-diyl) (P3HT) hybrid thin films, and show that they satisfy a fluctuation-induced tunnelling model that is strongly depended on their microstructures; moreover, a magnetoresistance in these thin films was also observed. Finally, the magnetic properties and phase stability of MNCs can also be strongly altered as a result of this interplay. Three phase transformations are observed in cobalt ferrofluids for T [?] 10-300 K, namely second order magnetic phase transformations (blocked-unblocked transition) at the blocking temperature of the magnetic NP, first order magnetic and structural phase transformations at the solvent melting temperature, TM, and second order premelting transformation at TPM < T < TM. These transformations show specific magnetic signatures in field-cool and zero-field-cool magnetization measurements and are qualitatively in agreement with predictions using M-spectrum theory. [ABSTRACT FROM AUTHOR]

Hydrophobins are a group of small amphiphilic proteins which are known to self-assemble on interfaces. They contain eight conserved cysteine residues, which make four disulfide bridges. A new hydrophobin protein, HFBIII, from the fungus Trichoderma reesei contains one extra cysteine residue, giving the protein a naturally reactive site. The self-assembly of hydrophobin protein HFBIII was studied using grazing-incidence X-ray diffraction and reflectivity. HFBIII self-assembles into a hexagonally ordered monolayer at an air/water interface and also forms crystalline coatings on a silicon substrate. The lattice constants for the hexagonal coatings are a = b = 56.5 Å, γ = 120°. The self-assembled structure in the HFBIII film is very similar to those formed by two other T. reesei hydrophobins, HFBI and HFBII. [ABSTRACT FROM AUTHOR]