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An advanced image analysis algorithm is presented for extracting growth curves for individual embedded subgrains during static recovery of deformed metals. The data are obtained by three dimensional X-ray diffraction microscopy. Based on a 5D multicomponent labelling scheme embedded in the full five dimensional experimental space, the algorithm is much faster and less biased than one previously used for the same purpose. The use of the methodology is demonstrated on a study of static recovery in an AA1200 specimen cold rolled to a true strain of 2. [ABSTRACT FROM AUTHOR]

An X-ray diffraction method is introduced for monitoring the change in volume and orientation of individual, embedded subgrains during static recovery. It is limited to plate-like specimens with a thickness of less than 100 subgrain sizes. Growth curves are presented for nine subgrains within a 38% cold-rolled aluminium specimen during annealing for 3 h at 300 °C. [Copyright &y& Elsevier]

The 3DXRD concept is extended to the characterisation of elements within the microstructure of deformed metals. Using orientation contrast, the dynamics of individual embedded cells are characterised as a function of annealing with a size-limitation of 100 nm. Applications for studies of recovery and nucleation are demonstrated and discussed. [Copyright &y& Elsevier]