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Ge‐rich Ge–Sb–Te alloy is a good candidate for future automotive applications due to its high crystallization temperature, which allows good data retention at elevated temperatures. Crystallization in this material is governed by elemental segregation which is key to thermal stability and device performance. In this work, elemental (Ge, Sb, Te) segregation is studied in situ during thermal annealing of Ge‐rich Ge–Sb–Te thin films using X‐ray fluorescence microscopy at ID16B beamline of ESRF with a beam size of 50 nm. Spatially resolved maps of Ge, Te, and Sb fluorescence yield are monitored and statistically analyzed as a function of temperature/time. In all investigated samples Sb appears to segregate much less than Te and Ge, indicating a lower mobility of this element. In situ, fluorescence mapping of samples doped with different amounts of carbon by ion implantation shows that carbon delays Ge and Te segregation to higher temperatures. Comparison with crystallization kinetics monitored by X‐ray diffraction shows a good correlation between the occurrence of spatially resolved chemical inhomogeneities and the appearance of crystallized phases. [ABSTRACT FROM AUTHOR]

Face-centered cubic/body centered cubic (FCC/BCC) nanolaminates prepared by Accumulative Roll Bonding (ARB) have been extensively studied because of their unique mechanical properties. Recently, micro-beam bending experiments, performed on Cu/Nb ARB samples, have shown an anisotropic interface sliding behavior linked to the strong in-plane texture. To test interface sliding on a macroscale we have developed a shear test based upon a specific sample geometry and on in situ tensile loading on an X-ray synchrotron beamline. As received nanolaminate samples exhibit a very anisotropic crystallographic texture as expected from the fabrication process. In situ X-ray diffraction in the sheared zone during mechanical loading yields strains in Cu and Nb. Early brittle failure prevents investigating further the sliding at interfaces. This is probably caused by crack initiation from the inner surfaces of the notches used to induce shear. [ABSTRACT FROM AUTHOR]

A compact scanning force microscope has been developed for in situ combination with nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its capabilities are demonstrated on Au nano-islands grown on a sapphire substrate. The new in situ device allows for in situ imaging the sample topography and the crystallinity by recording simultaneously an atomic force microscope (AFM) image and a scanning X-ray diffraction map of the same area. Moreover, a selected Au island can be mechanically deformed using the AFM tip while monitoring the deformation of the atomic lattice by nanofocused X-ray diffraction. This in situ approach gives access to the mechanical behavior of nanomaterials. [ABSTRACT FROM AUTHOR]