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Recent work on Pitman closeness has compared estimators under Type-II censored samples from an exponential distribution. More recently, a comparison was done for Type-I censored data wherein two es...

Across different types of lifetime studies, whether it be in the medical or engineering sciences, the possibility of competing causes of failures needs to be addressed. Typically referred to as com...

In this paper, we consider two well-known parametric long-term survival models, namely, the Bernoulli cure rate model and the promotion time (or Poisson) cure rate model. Assuming the long-term survival probability to depend on a set of risk factors, the main contribution is in the development of the stochastic expectation maximization (SEM) algorithm to determine the maximum likelihood estimates of the model parameters. We carry out a detailed simulation study to demonstrate the performance of the proposed SEM algorithm. For this purpose, we assume the lifetimes due to each competing cause to follow a two-parameter generalized exponential distribution. We also compare the results obtained from the SEM algorithm with those obtained from the well-known expectation maximization (EM) algorithm. Furthermore, we investigate a simplified estimation procedure for both SEM and EM algorithms that allow the objective function to be maximized to split into simpler functions with lower dimensions with respect to model parameters. Moreover, we present examples where the EM algorithm fails to converge but the SEM algorithm still works. For illustrative purposes, we analyze a breast cancer survival data. Finally, we use a graphical method to assess the goodness-of-fit of the model with generalized exponential lifetimes.

In this paper we consider correlation-type tests based on plotting points which are modifications to the simultaneous closeness probability plotting points as recently introduced in the literature. In particular, we consider a maximal correlation test and a minimal correlation test. Furthermore, we provide two methods to carry out each test, where one method uses plotting points which are data dependent and the other test uses plotting points which are not. Some numerical properties on the associated correlation statistics are provided for various distributions, as well as a comprehensive power study to assess their performance in comparison to correlation-type tests based on more traditional plotting points. Two illustrative examples are also provided to demonstrate the tests. Finally, we make some observations and provide ideas for future work.

In this paper, we consider two problems concerning two independent progressively Type-II censored samples. We first consider the Pitman closeness (PC) of order statistics from two independent progressively censored samples to a specific population quantile. We then consider the point prediction of a future progressively censored order statistic and discuss the determination of the closest progressively censored order statistic from the current sample according to the simultaneous closeness probabilities. For both these problems, explicit expressions are derived for the pertinent PC probabilities, and then special cases are given as examples. For various censoring schemes, we also present numerical results for the standard uniform, standard exponential, and standard normal distributions. Finally, a distribution-free result for the median is obtained.

Recent work on Pitman closeness has compared estimators under Type-II censored samples from exponential distribution based on observed number of failures. In this paper, we carry out similar Pitman closeness comparisons for Type-I censored samples from exponential distribution based on time under test.

In this paper, we focus on Pitman closeness probabilities when the estimators are symmetrically distributed about the unknown parameter θ. We first consider two symmetric estimators θˆ1 and θˆ2 and obtain necessary and sufficient conditions for θˆ1 to be Pitman closer to the common median θ than θˆ2. We then establish some properties in the context of estimation under the Pitman closeness criterion. We define Pitman closeness probability which measures the frequency with which an individual order statistic is Pitman closer to θ than some symmetric estimator. We show that, for symmetric populations, the sample median is Pitman closer to the population median than any other independent and symmetrically distributed estimator of θ. Finally, we discuss the use of Pitman closeness probabilities in the determination of an optimal ranked set sampling scheme (denoted by RSS) for the estimation of the population median when the underlying distribution is symmetric. We show that the best RSS scheme from symmetric p...

In this work, we extend prior results concerning the simultaneous Pitman closeness of order statistics (OS) to population quantiles. By considering progressively type-II right-censored samples, we derive expressions for the simultaneous closeness probabilities of the progressively censored OS to population quantiles. Explicit expressions are deduced for the cases when the underlying distribution has bounded and unbounded supports. Illustrations are provided for the cases of exponential, uniform and normal distributions for various progressive type-II right-censoring schemes and different quantiles. Finally, an extension to the case of generalized OS is outlined.

We first compare the ranked set sampling (RSS) and simple random sampling schemes for the estimation of the population median through Pitman’s measure of closeness. Then, by using Banks’ criterion, we determine the frequency with which an individual order statistic is closer to the median than some symmetric estimator in an ϵ -neighbourhood of the median. Finally, we consider the simultaneous Pitman closeness criterion and identify the median RSS as the optimal RSS scheme for estimating the population median.

Selecting the optimal progressive censoring scheme for the exponential distribution according to Pitman closeness criterion is discussed. For small sample sizes the Pitman closeness probabilities are calculated explicitly, and it is shown that the optimal progressive censoring scheme is the usual Type-II right censoring case. It is conjectured that this to be the case for all sample sizes. A general algorithm is also presented for the numerical computation of the Pitman closeness probabilities between any two progressive censoring schemes of the same size.

Prediction of censored order statistics from a Type-II censored sample can be done with trivial bounds having perfect confidence. However, given independent samples from the same absolutely continuous distribution, improved bounds can be attained. In this regard, we develop here point prediction based on L-statistics for predicting order statistics (OS) from a future sample as well as for predicting censored OS from a Type-II censored sample. An example is taken to illustrate these ideas, and the limiting case wherein a single independent sample is arbitrarily large is also discussed.

Plotting points of order statistics are often used in the determination of goodness-of-fit of observed data to theoretical percentiles. Plotting points are usually determined by using nonparametric methods which produce, for example, the mean- and median-ranks. Here, we use a distribution-based approach which selects plotting points (quantiles) based on the simultaneous-closeness of order statistics to population quantiles. We show that the plotting points so determined are robust over a multitude of symmetric distributions and then demonstrate their usefulness by examining the power properties of a correlation goodness-of-fit test for normality.

Best linear unbiased, best linear invariant, and maximum likelihood predictors are commonly used in reliability studies for predicting either censored failure times or lifetimes from a future life-test. In this article, by assuming a Type-II right-censored sample from an exponential distribution, we compare best linear unbiased (BLUP) and best linear invariant (BLIP) predictors of the censored order statistics in the one-sample case and order statistics from a future sample in the two-sample case, in terms of Pitman closeness criterion. Some specific conclusions are drawn and supporting numerical results are presented.

Comparisons of best linear unbiased estimators with some other prominent estimators have been carried out over the last 50 years since the ground breaking work of Lloyd [E.H. Lloyd, Least squares estimation of location and scale parameters using order statistics, Biometrika 39 (1952), pp. 88–95]. These comparisons have been made under many different criteria across different parametric families of distributions. A noteworthy one is by Nagaraja [H.N. Nagaraja, Comparison of estimators and predictors from two-parameter exponential distribution, Sankhyā Ser. B 48 (1986), pp. 10–18], who made a comparison of best linear unbiased (BLUE) and best linear invariant (BLIE) estimators in the case of exponential distribution. In this paper, continuing along the same lines by assuming a Type II right censored sample from a scaled-exponential distribution, we first compare BLUE and BLIE of the exponential mean parameter in terms of Pitman closeness (nearness) criterion. We show that the BLUE is always Pitman closer th...

In reliability studies, one typically would assume a lifetime distribution for the units under study and then carry out the required analysis. One popular choice for the lifetime distribution is the family of two-parameter Weibull distributions (with scale and shape parameters) which, through a logarithmic transformation, can be transformed to the family of two-parameter extreme value distributions (with location and scale parameters). In carrying out a parametric analysis of this type, it is highly desirable to be able to test the validity of such a model assumption. A basic tool that is useful for this purpose is a quantile–quantile (QQ) plot, but in its use, the issue of the choice of plotting position arises. Here, by adopting the optimal plotting points based on Pitman closeness criterion proposed recently by Balakrishnan et al. (2010b), and referred to as simultaneous closeness probability (SCP) plotting points, we propose a correlation-type goodness of fit test for the extreme value distribution. W...

This paper presents an extension to the the Ivanoff–Merzbach renewal process. The Ivanoff–Merzbach process is a natural analogue to the one-dimensional renewal process. Restricting our attention to two dimensions, the focus of the current paper will be formation of this extension, which we will refer to as a Markov renewal process, as well as simulation, estimation and applications to data sets in ecology and forestry. Copyright © 2010 John Wiley & Sons, Ltd.

We derive expressions for the probability that an individual order statistic is closest to the target parameter among the order statistics from a complete random sample. Results are given for random variables with bounded and complete support. We then apply these general results to location-scale parameter families of distributions with specific applications to estimation of percentiles. In this case, simultaneous-closeness probabilities depend upon the parameters through the value of p in the percentile and the sample size, n. Results are finally illustrated with the estimation of percentiles for normal and exponential distributions.

In this paper, we consider joint distributions of order statistics generated by two simulation methods. By using these distributions, we study the nature of dependence and exceedence probabilities between them.

In this article, Pitman closeness of sample order statistics to population quantiles of a location-scale family of distributions is discussed. Explicit expressions are derived for some specific families such as uniform, exponential, and power function. Numerical results are then presented for these families for sample sizes n = 10,15, and for the choices of p = 0.10, 0.25, 0.75, 0.90. The Pitman-closest order statistic is also determined in these cases and presented.

This paper introduces nonparametric estimation methods for spatial point processes satisfying a particular renewal property. Martingale methods yield a unified approach for renewal processes in both one and two dimensions, and can be used for both synchronous and asynchronous data. In each case, we obtain martingale estimators of the avoidance probabilities that characterize the renewal process. Asymptotic properties of the estimators are studied analytically and empirically.

This paper demonstrates how to apply the Ivanoff–Merzbach renewal process (Ivanoff and Merzbach, 2006; Ivanoff, 2008) to the modelling of environmental and other forms of point process data. The model is explored via simulation, focusing on two special cases. Maximum likelihood estimation of model parameters is described and demonstrated for these cases. The methods are applied to a point pattern related to human settlement patterns and to a point pattern describing the locations of a species of pine. Copyright © 2009 John Wiley & Sons, Ltd.