1. Speckle-based modulation transfer function measurements for comparative evaluation of CCD and CMOS detector arrays
- Author
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Manuel Rubiño, Antonio M. Pozo, and Alicia Fernández-Oliveras
- Subjects
Reproducibility ,Speckle pattern ,Integrating sphere ,Materials science ,Optics ,Semiconductor ,CMOS ,business.industry ,Optical transfer function ,Detector ,Port (circuit theory) ,business ,Atomic and Molecular Physics, and Optics - Abstract
Charge-coupled device (CCD) and complementary metal-oxide semiconductor (CMOS) matrices offer excellent features in imaging systems. For assessing the suitability of each technology according to the application, the complete characterization of the detector arrays becomes necessary. A system is optically characterized by the modulation transfer function (MTF). We have comparatively studied the results provided by the speckle method for detectors of two types: CCD and CMOS. To do so, we first analysed the precision in determining the MTF of the CCD using two apertures at the exit port of an integrating sphere: a single and a double-slit. For the single-slit, we propose a new procedure of fitting the experimental data which overcomes the drawbacks of the conventional procedure. Since it offered lower uncertainty and better reproducibility, the single-slit was used for the study with the CMOS detector. Significant differences were found between the MTF of the CCD and the CMOS detectors.
- Published
- 2013
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