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Solder interconnects are essential to the reliability of electronic devices. The addition of alloying elements was reported to provide beneficial effects to the microstructure and mechanical reliability of lead-free solder alloys. In this work, the effects of Sb addition on the mechanical behavior of SAC305 solder alloy were investigated. Based on differential thermal analysis, it was observed that melting point of SAC-Sb solder was slightly higher than that of SAC305. The mechanical behavior was studied at different temperatures (25 °C–125 °C) and strain rates (1 × 10−4 – 1 × 10−2 1/s) for SAC-Sb and SAC 305 solders as a comparison. From the results, ultimate tensile strength of SAC-Sb (10–72 MPa) was generally higher than that of SAC305 (4.54–61.5 MPa) at the aforementioned test conditions. A linear relation between the UTS and yield strength and temperature was identified for test results of SAC305, but the relation was found to be nonlinear for SAC-Sb solder because of solution strengthening effect of Sb in the Sn matrix. Parameters of Anand model were estimated based on mechanical behavior of SAC-Sb and SAC305 solders. Next, the model was used to evaluate thermal fatigue life of an insulated gate bipolar transistor (IGBT) module with SAC-Sb and SAC305 as chip-to-directed bonding copper (DBC) and DBC-to-baseplate attachment materials by finite element modeling. The increase of maximum inelastic strain in one thermal cycle in SAC-Sb solder joints was lower than that in SAC305 solder joints. This result indicates that SAC-Sb solder can provide a considerably better fatigue life under harsh service conditions. [ABSTRACT FROM AUTHOR]

With the increase in the power density of power semiconductor chips, the lateral temperature gradient over the chip surface becomes more pronounced. Temperature gradients play an important role in reliability evaluation of IGBTs and have attracted great attentions. In this paper, the influence of IGBT chip temperature gradients on the crack initiation site and propagation path of the solder layer is investigated by finite-element analysis (FEA). Results indicated that the temperature gradient could influence the mechanism of solder layer fatigue. With the temperature gradient increasing, the crack initiation site shifts from the edge of solder layer to the center. The crack propagation path also changed. The fatigue mechanism of the solder layer under high temperature gradients is investigated by FEA. The inelastic strain energy density per cycle (ΔW) is found to be unequal at crack initiation and crack propagation stages. Accordingly, a novel energy-based lifetime prediction model based on Darveaux's model for solder layer fatigue of IGBTs is proposed, which takes into account the variation of ΔW within these two stages and can better characterize the processes of crack initiation and propagation in the solder layer. Subsequently, two lifetimes of IGBT modules under accelerated aging tests from the existing publications are used to verify the effectiveness of the proposed model. Finally, the accelerated aging tests were carried out to support the theoretical analysis on the direction of crack propagation under high temperature gradients. • The influence of temperature gradient on crack initiation site and propagation path is investigated by FEA • The fatigue mechanism under high temperature gradients is investigated by adding solder layer cracks with different lengths • An energy-based lifetime prediction model for solder layers of IGBT modules under high temperature gradients is proposed • ΔW is inequality in crack initiation and propagation stage [ABSTRACT FROM AUTHOR]

Physical lifetime prediction methods based on inelastic strain energy density (energy-based lifetime prediction) have been proven to be effective in producing reliable results on small solder joints (ball-grid arrays or chip-scale package) due to their capabilities to represent physical characteristics of soldering materials and loading history. However, in the existing energy-based lifetime models for solder layer failure the inelastic strain energy density is usually assumed to unchanged during aging, which is untrue particularly for large-area solder joints when crack propagation is considered. In this paper, an energy-based lifetime prediction method is proposed for failure of IGBT modules by explicit emulation of solder layer degradation. Inelastic strain energy density variances with respect to aging are meticulously modeled. The large-area solder layer is evenly divided into meshed elements, birth and death technique in finite element analysis (FEA) is used to successively emulate crack propagation. In this way, the increment of thermal resistance due to the solder layer degradation can be predicted. The lifetime prediction results by our proposed method show nice agreement with the experiment under different aging conditions. • An energy-based lifetime prediction method is proposed for failure of IGBT modules • Birth and death technique in FEA is used to successively emulate crack propagation • The increment of thermal resistance due to the solder layer degradation can be predicted • ΔW will change with different aging stage [ABSTRACT FROM AUTHOR]