1. Hot-phonon temperature and lifetime in biased 4H-SiC.
- Author
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Matulionis, A., Liberis, J., Matulioniene, I., Cha, H.-Y., Eastman, L.F., and Spencer, M.G.
- Subjects
SEMICONDUCTORS ,SILICON carbide ,ELECTRON temperature ,ELECTRON transport ,PHONONS ,ELECTRIC fields - Abstract
Experimental results on electron transport and microwave noise are used to investigate, in the electron temperature approximation, dissipation of hot-electron energy in a biased donor-doped 4H-SiC channel (n=2·10
17 cm-3 ). The electron energy relaxation time is estimated to be 2.8±1 ps in the electric-field range below 25 kV/cm at room temperature. Longitudinal-optical phonons are found responsible for electron energy dissipation when the supplied power ranges from 0.5 to 25 nW per electron. In this range, accumulation of nonequilibrium (hot) longitudinal-optical phonons takes place. Equivalent hot-phonon temperature reaches 3000 K near 30 kV/cm, hot-phonon lifetime is comparable to the electron energy relaxation time. Dependence of the lifetime on electric field is weak in the investigated range of electric fields below 50 kV/cm. [ABSTRACT FROM AUTHOR]- Published
- 2004
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