1. Influence of Seed Layer on Surface Morphology of ZnO Thin Films Grown by SILAR Method.
- Author
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Dharani, A. P., Amalraj, A. Sales, Joycee, S. Christina, Sivakumar, V., and Senguttuvan, G.
- Subjects
ZINC oxide films ,SURFACE morphology ,THIN films ,ZINC oxide ,SCANNING electron microscopes ,SEEDS - Abstract
Zinc oxide (ZnO) nanostructured seed layer was grown by successive ionic layer adsorption and reaction (SILAR) method on glass substrate. The as-prepared nanostructured seed layer was characterized by X-ray diffraction (XRD) and scanning electron microscope (SEM) for its structure and surface morphology. XRD results showed a ZnO seed layer growth oriented along the (100) direction. Study of surface morphology showed ZnO nanocrystal clusters with hexagonal shape. ZnO nanorods (NRs) have been grown over the as-prepared ZnO nanostructured seed layer by immersing seed layer substrate in a chemical bath. It has been found that the morphology of the nanostructured seed layer is a key influencing factor for the growth of vertical ZnO NRs. In our growth method, we were successful in growing vertical NRs with diameter of about 100–240 nm with perfect hexagonal shape. The transmittance studies were carried out to analyze the optical bandgap of the as-grown ZnO nanorods. [ABSTRACT FROM AUTHOR]
- Published
- 2020
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