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The back diffusion processes in Ar, SF6, and Ar + SF6 binary mixtures are analyzed by a Monte Carlo simulation method employing realistic collision cross sections of the respective component gases in the E/N range from 50 to 500 Td. The escape factors in pure Ar are always higher than that of those in pure SF6, and as the SF6 content in the binary mixture increases, the escape factors decrease accordingly. Furthermore, the number of collisions observed for the backscattered electrons before returning to cathode in SF6 are smaller than that of those in Ar, and as the SF6 content in the binary mixture increases, the mean number of collisions of the backscattered electrons decrease accordingly. [ABSTRACT FROM AUTHOR]

The effective ionization coefficients in ultradilute SF6 + N2 gas mixtures are calculated from a Monte Carlo technique over the range 100 ≤ E/N ≤ 270 Td together with electron drift velocities and pulsed Townsend mean energies. SF6 contents in the mixtures of 0.1%, 0.3%, 0.5%, 0.7%, and 1% are considered. The effective ionization coefficients decrease with the increase of the SF6 concentration in the mixtures at a given E/N, while the variation of the drift velocities and pulsed Townsend mean energies with respect to SF6 concentrations is relatively constant in the E/N range of this paper. [ABSTRACT FROM AUTHOR]

The limiting equivalent electric fields in N2 + SF6 binary gas mixtures due to Townsend discharges are evaluated directly from a Monte-Carlo simulation when the mixture is subjected to orthogonal electric and magnetic fields. Along with the limiting equivalent electric fields, transverse and perpendicular drift velocities, electron mean energies and collision frequencies are also determined within the scope of the Monte-Carlo simulation. The equivalent reduced electric field (EREF) concept for the corresponding limiting electric fields is also investigated for the calculated mean energy levels and collision frequencies. The EREF values are found to be in good agreement with the previously published limiting electric field data. [ABSTRACT FROM AUTHOR]