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Abstract: InAlN/AlN/GaN semiconductor heterostructures with a barrier thickness of 5-13 nm have been grown by metalorganic vapor phase epitaxy (MOVPE) on sapphire and SiC substrates. Optimization of GaN buffer and InAlN layers allows fabricating structures with sheet conductivity values below 210 Ohm/sq. High electron mobility transistors (HEMTs) fabricated from such structures show drain current value exceeding 1.25 A/mm with maximum transconductance of 450 mS/mm. Use of thin in situ Si3N4 capping allows to fabricate and compare HEMT and MIS-HEMTs. [ABSTRACT FROM AUTHOR]

Composite InGaN/GaN/InAlN quantum dots (QDs) have been formed and studied. The structural properties of thin InAlN layers overgrown with GaN have been analyzed, and it is shown that 3D islands with lateral sizes of ∼(20-30) nm are formed in structures of this kind. It is demonstrated that deposition of a thin InGaN layer onto the surface of InAlN islands overgrown with a thin GaN layer leads to transformation of the continuous InGaN layer to an array of isolated QDs with lateral sizes of 20-30 nm and heights of 2-3 nm. The position of these QDs in the growth direction correlates with that of InAlN islands. [ABSTRACT FROM AUTHOR]

A new approach to development of effective monolithic white-light emitters is described based on using a short-period InGaN/GaN superlattice as a barrier layer in the active region of LED structures between InGaN quantum wells emitting in the blue and yellow-green spectral ranges. The optical properties of structures of this kind have been studied, and it is demonstrated that the use of such a superlattice makes it possible to obtain effective emission from the active region. [ABSTRACT FROM AUTHOR]

Effect of pressure in the reactor in the case of growth of active regions in the InGaN/GaN light-emitting diodes by the method of vapor-phase epitaxy from metalorganic compounds on their electroluminescent and structural properties has been studied. It is shown that, as pressure is increased, the InGaN layers become transformed from being continuous in the lateral direction to the layers of separate InGaN islands. This transformation affects both the emission efficiency and the dependence of efficiency on current. [ABSTRACT FROM AUTHOR]

GaN-based structures with InGaN quantum dots in the active region, which emit in the blue and green spectral ranges, are studied. The structures grown by both the conventional method and with the use of special procedures of the growth of the active region were compared. The use of these special growth modes stimulates the activated phase decomposition, which leads to the formation of quantum dots with substantially larger localization depth of electrons. It is shown that the formation of such deep quantum dots, like the formation of larger inhomogeneities of the active region, substantially suppresses the lateral carrier transport. This effect improves the characteristics of light-emitting diode structures at a low injection level and increases the temperature stability of quantum efficiency. [ABSTRACT FROM AUTHOR]

The carrier statistics in LED structures with ultrathin multilayer InGaN insertions in a GaN matrix was studied. The optical data obtained indicate that an array of quantum dots (QDs) is formed in these structures. The QDs are scattered in size, which leads to an inhomogeneous broadening of the energy spectrum of carriers localized in the QDs. It is shown that, despite the suppressed transport of carriers between QDs, carriers are distributed among the levels of the QD array quasi-statistically at temperatures of about room temperature and higher. This makes it possible to describe the carrier injection and recombination in the device structures studied in terms of quasi-Fermi levels for electrons and holes. © 2005 Pleiades Publishing, Inc. [ABSTRACT FROM AUTHOR]

The electrical and optical properties of light-emitting devices with an active region containing several layers of InGaN/GaN quantum dots (QDs) separated by GaN spacers are studied. It is shown that the overgrowth of the QD layer with an InGaN layer that has a reduced In content at higher temperatures raises the confinement energy of carriers in QDs. Furthermore, inhomogeneous carrier injection, predominantly into regions with higher confinement energy, is observed. The electrical and optical properties of p–n junctions and the effect of the inhomogeneities on these properties are studied in detail. It is shown that the shifts of photoluminescence and electroluminescence lines, which are observed when changing the experimental conditions, are related to these properties of the inhomogeneities in the p–n junction. © 2005 Pleiades Publishing, Inc. [ABSTRACT FROM AUTHOR]