1. Comment.
- Author
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Gaver, Donald P. and Jacobs, Patricia A.
- Subjects
- *
SYSTEM failures , *RANDOM access memory , *POISSON distribution , *RELIABILITY in engineering - Abstract
In this article, the authors discuss a TAFT (Test, Analyze, Fix, Test) procedure applied to a simple, but new model of system failure. They say that the process was the result of the U.S. Department of Defense (DoD) policy makers asking for programs that execute a viable random access memory (RAM) strategy. They say that the methodology is designed to describe reliability growth of discrete use systems and that the Poisson approximation for the distribution of failure modes is plausible.
- Published
- 2010
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