1. Investigation of structural, optical and radiation shielding properties of boron-doped In2O3 thin films.
- Author
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Kavgacı, Mustafa, Küçükönder, Adnan, and Kerli, Süleyman
- Subjects
RADIATION shielding ,ATTENUATION coefficients ,MASS attenuation coefficients ,INDIUM oxide ,THIN films ,ZINC oxide films ,OXIDE coating ,BORON oxide - Abstract
Indium oxide and boron-doped indium oxide thin films were produced using the spray pyrolysis method. XRD measurements were made to determine the structural properties of these synthesized films, and it was observed that the films had a cubic structure. Morphological properties were examined, and it was observed that films were generally homogeneous. It has been observed from the Uv–Vis spectrometer measurements that the transmittance rates increase with the boron doping. The mass and linear attenuation coefficients, half-value layer, mean free path and tenth value layer of different percentages for undoped and boron-doped thin films were investigated experimentally. Electron detector and 6 MeV energy electrons were used in irradiation to make these measurements. The experimental results determined that added boron to indium oxide thin films positively contributed to the radiation shielding property. [ABSTRACT FROM AUTHOR]
- Published
- 2021
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