1. Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains.
- Author
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Dodd, Paul E., Shaneyfelt, Marty R., Flores, Richard S., Schwank, James R., Hill, Thomas A., McMorrow, Dale, Vizkelethy, Gyorgy, Swanson, Scot E., and Dalton, Scott M.
- Subjects
SINGLE event effects ,RADIATION hardening (Electronics) ,COMPLEMENTARY metal oxide semiconductors ,SILICON-on-insulator technology ,IONIZATION (Atomic physics) ,MONTE Carlo method ,MATHEMATICAL models ,COULOMB functions ,BINDING energy - Abstract
Single-event upsets are studied in digital logic cells in a radiation-hardened CMOS SOI technology. The sensitivity of SEU to different strike locations and hardening approaches is explored using broadbeam and focused beam experiments. Error distributions in chains of logic flip-flops are studied to determine the impact of various cell designs and hardening techniques on upset uniformity. [ABSTRACT FROM PUBLISHER]
- Published
- 2011
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