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A study of proton-induced destructive SEE (DSEE) from Au-plated lid fission fragments has been expanded. Seventeen additional lid materials (Z =26–83) are studied. Lead (Pb) produced a higher sensitivity than seen in previous work with gold (Au), raising new concerns of SEE enhancement due to die-proximate Pb-based solder in flip-chip package designs. New analysis has allowed generalized RHA rules to be developed. [ABSTRACT FROM PUBLISHER]

Proton single event dielectric rupture was observed in Analog Devices OP470 devices only when the package included gold flashing facing the die on the inner surface of the metal lid. The supply voltage was also a factor. Analysis shows that proton on gold fission fragments have the linear energy transfer and range to cause this effect. The physics of proton on gold reactions and radiation hardness assurance implications are explored. [ABSTRACT FROM PUBLISHER]

This paper presents the untold history of the early days of the Single Event Effects (SEE) revolution. It emphasizes the period from 1978 to 1983 when single events went from unknown to a major part of radiation effect studies. Some threads are followed to current studies to place ideas in context. There were two aspects that were revolutionary. Conceptually, the community was not ready for radiation effects that depended on single particles. Second, the test community needed to transition to testing using particle accelerators. The article will discuss how various organizations and individuals were introduced to the problem and how they developed what became the common knowledge of single event effects. [ABSTRACT FROM PUBLISHER]

A comparison of heavy-ion and proton-induced single event effect sensitivities has been made using the Xilinx Virtex-II field programmable gate array (FPGA). Recently fabricated test samples are selected for observations of single event upset and single event functional interrupt. A complex relationship appears to exist between the heavy ion and proton sensitivities due to effects such as multiple-bit upsets and elastic nuclear scattering. [ABSTRACT FROM AUTHOR]

Presents a study that investigated the relationship between measure proton sensitivity and calculated proton sensitivity derived from heavy ion test results. Examination of semi-empirical model simulating proton sensitivity; Analysis of measured and predicted proton-induced upsets; Assessment of the heavy ion test methods and upset results.