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Product obsolescence occurs in the manufacturing industry as new products with better performance or improved cost-effectiveness are developed. A proactive strategy for predicting component obsolescence can reduce manufacturing losses and lead to customer satisfaction. In this study, we propose a machine learning algorithm for a proactive strategy based on an adaptive data selection method to forecast the obsolescence of electronic diodes. Typical machine learning algorithms construct a single model for a dataset. By contrast, the proposed algorithm first determines a mathematical cover of the dataset via unsupervised clustering and subsequently constructs multiple models, each of which is trained with the data in one cover. For each data point in the test dataset, an optimal model is selected for regression. Results of empirical experiments show that the proposed method improves the obsolescence prediction accuracy and accelerates the training procedure. A novelty of this study is that it demonstrates the effectiveness of unsupervised clustering methods for improving supervised regression algorithms. [ABSTRACT FROM AUTHOR]

Product obsolescence occurs in every production line in the industry as better-performance or cost-effective products become available. A proactive strategy for obsolescence allows firms to prepare for such events and reduces the manufacturing loss, which eventually leads to positive customer satisfaction. We propose a machine learning-based algorithm to forecast the obsolescence date of electronic diodes, which has a limitation on the amount of data available. The proposed algorithm overcomes these limitations in two ways. First, an unsupervised clustering algorithm is applied to group the data based on their similarity and build independent machine-learning models specialized for each group. Second, a hybrid method including several reliable techniques is constructed to improve the prediction accuracy and overcome the limitation of the lack of data. It is empirically confirmed that the prediction accuracy of the obsolescence date for the electrical component data is improved through the proposed clustering-based hybrid method. [ABSTRACT FROM AUTHOR]