1. Piezoresponse force microscopy imaging and its correlation with cantilever spring constant and frequency.
- Author
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Solís Canto, O., Murillo-Bracamontes, E. A., Gervacio-Arciniega, J. J., Toledo-Solano, M., Torres-Miranda, G., Cruz-Valeriano, E., Chu, Y. H., Palomino-Ovando, M. A., Enriquez-Flores, C. I., Mendoza, M. E., Hmŏk, H'Linh, and Cruz, M. P.
- Subjects
PIEZORESPONSE force microscopy ,ATOMIC force microscopy ,CANTILEVERS ,FERROELECTRIC materials ,SPRING ,THIN films - Abstract
Single-frequency piezoresponse force microscopy (PFM) images of a BiFeO
3 /DyScO3 (110) thin film, obtained with long (kc = 0.82 N/m) and short (kc = 7.64 N/m) cantilevers, were analyzed as a function of the applied voltage frequency. For long cantilevers, the electrostatic and electrostrictive contributions were identified. These contributions were reduced with a frequency near the second mode of the contact resonance; while for short cantilevers, the first mode was necessary. A method for domain structure analyses, to discriminate a ferroelectric behavior from a non-ferroelectric, through the optimization of PFM images, is also described. The analysis can be extended to cantilevers with different spring constants and ferroelectric materials. [ABSTRACT FROM AUTHOR]- Published
- 2020
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