1. Strain-induced improvement of retention loss in PbZr0.2Ti0.8O3 films.
- Author
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Guo, E. J., Roth, R., Das, S., Herklotz, A., and Dörr, K.
- Subjects
EPITAXIAL layers ,PIEZOELECTRIC materials ,PIEZOELECTRICITY ,COMPUTER storage devices ,ELECTRODES ,ELECTRICAL conductors - Abstract
The retention behavior of nanoscale domains in PbZr
0.2 Ti0.8 O3 thin films is investigated by in-situ controlling the epitaxial strain arising from a piezoelectric substrate. The retention behavior in our sample shows strong polarity-dependence: Upward-poled domains exhibit excellent stability, whereas downward-poled domains reveal a stretched exponential decay. Reversible release of in-plane compressive strain strongly reduced the retention loss, reflected in an enhancement of the relaxation time by up to one order of magnitude. We tentatively attribute the observed behavior to a strain dependence of the built-in field at the interface to the La0.7 Sr0.3 MnO3 bottom electrode, with a possible further contribution of strain-dependent screening of the depolarizing field. Our work directly reveals the importance of epitaxial strain for reducing ferroelectric domain relaxation which is detrimental for applications such as nonvolatile memory devices. [ABSTRACT FROM AUTHOR]- Published
- 2015
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