1. Increased robustness and speed in low-dose phase-contrast tomography with laboratory sources
- Author
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Fabio A. Vittoria, Paolo De Coppi, Marco Endrizzi, Alessandro Olivo, Charlotte K. Hagen, Anna Zamir, Paul C. Diemoz, and Luca Urbani
- Subjects
Physics ,medicine.diagnostic_test ,Scattering ,business.industry ,Low dose ,Phase-contrast imaging ,Synchrotron radiation ,Computed tomography ,02 engineering and technology ,021001 nanoscience & nanotechnology ,01 natural sciences ,010309 optics ,Robustness (computer science) ,0103 physical sciences ,medicine ,Computer vision ,Artificial intelligence ,Tomography ,0210 nano-technology ,Phase retrieval ,business - Abstract
In this article we discuss three different developments in Edge Illumination (EI) X-ray phase contrast imaging (XPCi), all ultimately aimed at optimising EI computed tomography (CT) for use in different environments, and for different applications. For the purpose of reducing scan times, two approaches are presented; the reverse projection" acquisition scheme which allows a continuous rotation of the sample, and the single image" retrieval algorithm, which requires only one frame for retrieval of the projected phase map. These are expected to lead to a substantial reduction of EI CT scan times, a prospect which is likely to promote the translation of EI into several applications, including clinical. The last development presented is the "modified local" phase retrieval. This retrieval algorithm is specifically designed to accurately retrieve sample properties (absorption, refraction, scattering) in cases where high-resolution scans are required in non-ideal environments. Experimental results, using both synchrotron radiation and laboratory sources, are shown for the various approaches.
- Published
- 2016