1. The dedicated high-resolution grazing-incidence X-ray scattering beamline 8-ID-E at the Advanced Photon Source.
- Author
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Jiang, Zhang, Li, Xuefa, Strzalka, Joseph, Sprung, Michael, Sun, Tao, Sandy, Alec R., Narayanan, Suresh, Lee, Dong Ryeol, and Wang, Jin
- Subjects
X-ray scattering ,PHOTONS ,X-ray spectroscopy ,THIN films ,NANOSTRUCTURES - Abstract
As an increasingly important structural-characterization technique, grazing-incidence X-ray scattering (GIXS) has found wide applications for in situ and real-time studies of nanostructures and nanocomposites at surfaces and interfaces. A dedicated beamline has been designed, constructed and optimized at beamline 8-ID-E at the Advanced Photon Source for high-resolution and coherent GIXS experiments. The effectiveness and applicability of the beamline and the scattering techniques have been demonstrated by a host of experiments including reflectivity, grazing-incidence static and kinetic scattering, and coherent surface X-ray photon correlation spectroscopy. The applicable systems that can be studied at 8-ID-E include liquid surfaces and nanostructured thin films. [ABSTRACT FROM AUTHOR]
- Published
- 2012
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