1. Two-dimensional correlation analysis for x-ray photoelectron spectroscopy.
- Author
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Li, S, Driver, T, Haddad, A Al, Champenois, E G, Agĺker, M, Alexander, O, Barillot, T, Bostedt, C, Garratt, D, Kjellsson, L, Lutman, A A, Rubensson, J-E, Sathe, C, Marinelli, A, Marangos, J P, and Cryan, J P
- Subjects
X-ray photoelectron spectroscopy ,X-ray photoelectron spectra ,STATISTICAL correlation ,BINDING energy ,PHOTOELECTRONS - Abstract
X-ray photoelectron spectroscopy (XPS) measures the binding energy of core-level electrons, which are well-localised to specific atomic sites in a molecular system, providing valuable information on the local chemical environment. The technique relies on measuring the photoelectron spectrum upon x-ray photoionisation, and the resolution is often limited by the bandwidth of the ionising x-ray pulse. This is particularly problematic for time-resolved XPS, where the desired time resolution enforces a fundamental lower limit on the bandwidth of the x-ray source. In this work, we report a novel correlation analysis which exploits the correlation between the x-ray and photoelectron spectra to improve the resolution of XPS measurements. We show that with this correlation-based spectral-domain ghost imaging method we can achieve sub-bandwidth resolution in XPS measurements. This analysis method enables XPS for sources with large bandwidth or spectral jitter, previously considered unfeasible for XPS measurements. [ABSTRACT FROM AUTHOR]
- Published
- 2021
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