1. Integration of an Atomic Force Microscope in a Beamline Sample Environment
- Author
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M. S. Rodrigues, M. Hrouzek, O. Dhez, J. Chevrier, F. Comin, R. Garrett, I. Gentle, K. Nugent, and S. Wilkins
- Subjects
Diffraction ,Physics ,business.industry ,X-ray optics ,Synchrotron radiation ,Particle accelerator ,Conductive atomic force microscopy ,law.invention ,Optics ,Beamline ,law ,Attenuation coefficient ,Microscopy ,business - Abstract
We developed and optimised an optics‐free Atomic Force Microscope (AFM) that can be directly installed on most of the synchrotron radiation end‐stations. The combination of Scanning Probe Microscopies with X‐ray microbeams adds new possibilities to the variety of synchrotron radiation techniques. The instrument can be used for atomic force imaging of the investigated sample or to locally measure the X‐ray absorption or diffraction, or it can also be used to mechanically interact with the sample while simultaneously taking spectroscopy or diffraction measurements. The local character of these measurements is intrinsically linked with the use of the Atomic Force Microscope tip. It is the sharpness of the tip that gives the opportunity to measure the photons flux impinging on it giving beam position monitor features, or allows to locally measure the absorption coefficient or the shape of the diffraction pattern. As an example of the possibilities opened by the instrument we will show diffraction measurements performed on a Ge/Si island while being indented with the AFM tip providing local measure of the Young coefficient. Three ESRF beamlines are going to be equipped with this new instrument.
- Published
- 2010