1. X-ray phase imaging with the unified modulated pattern analysis of near-field speckles at a laboratory source
- Author
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Marie-Christine Zdora, Pierre Thibault, Hans Deyhle, Nicholas W. Phillips, Toby Walker, Ronan Smith, Irene Zanette, Sharif Ahmed, Zdora, M. -C., Zanette, I., Walker, T., Phillips, N. W., Smith, R., Deyhle, H., Ahmed, S., and Thibault, P.
- Subjects
Physics ,business.industry ,Image quality ,Near and far field ,Translation (geometry) ,01 natural sciences ,Atomic and Molecular Physics, and Optics ,Synchrotron ,Phase Contrast ,law.invention ,010309 optics ,Radiography ,Speckle pattern ,Optics ,Transmission (telecommunications) ,law ,0103 physical sciences ,Medical imaging ,Grating ,Sensitivity (control systems) ,Electrical and Electronic Engineering ,business ,Engineering (miscellaneous) ,Gratings - Abstract
X-ray phase-contrast techniques are powerful methods for discerning features with similar densities, which are normally indistinguishable with conventional absorption contrast. While these techniques are well-established tools at large-scale synchrotron facilities, efforts have increasingly focused on implementations at laboratory sources for widespread use. X-ray speckle-based imaging is one of the phase-contrast techniques with high potential for translation to conventional x-ray systems. It yields phase-contrast, transmission, and dark-field images with high sensitivity using a relatively simple and cost-effective setup tolerant to divergent and polychromatic beams. Recently, we have introduced the unified modulated pattern analysis (UMPA) [Phys. Rev. Lett. 118, 203903 (2017)PRLTAO0031-900710.1103/PhysRevLett.118.203903], which further simplifies the translation of x-ray speckle-based imaging to low-brilliance sources. Here, we present the proof-of-principle implementation of UMPA speckle-based imaging at a microfocus liquid-metal-jet x-ray laboratory source.
- Published
- 2020
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