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17 results on '"David J. Dingley"'

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1. High resolution mapping of strains and rotations using electron backscatter diffraction

2. QUANTITATIVE DEFORMATION STUDIES USING ELECTRON BACK SCATTER PATTERNS

3. Orientation Imaging Microscopy for the Transmission Electron Microscope

4. Extension of Orientation Mapping to the Transmission Electron Microscope

5. Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy

6. Fast Orientation Imaging Microscropy

7. Orientation Imaging in the Transmission Electron Microscope

8. Orientation contrast imaging of microstructures in rocks using forescatter detectors in the scanning electron microscope

9. Orientation Imaging Microscopy: New Possibilities for Microstructural Investigations Using Automated BKD Analysis

10. Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns

11. Strain mapping using electron backscatter diffraction

12. Mapping strains at the nanoscale using electron back scatter diffraction

14. The Use of Electron Backscatter Diffraction for the Investigation of Nano Crystalline Materials and the Move Towards Orientation Imaging in the TEM

15. The Development of Automated Diffraction in Scanning and Transmission Electron Microscopy

16. Strain Tensor Mapping at the Nanoscale using Electron Back Scatter Diffraction

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