1. Single-exposure simultaneous diffraction-enhanced imaging
- Author
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Hasnah, M., Oltulu, O., Zhong, Z., and Chapman, D.
- Subjects
- *
OPTICAL diffraction , *CRYSTALLOGRAPHY - Abstract
A new method of acquiring and analyzing diffraction-enhanced images (DEI) is presented. This method has been performed at the National Synchrotron Light Source and is based on using a novel two-crystal analyzer (Laue and Bragg analyzer). This system delivers simultaneously a pair of images with differing refraction sensitivity that is necessary for extracting absorption and refraction information using the DEI method. Although the system is not as flux efficient as a DEI system using a Bragg analyzer, it eliminates problems associated with object motion in between exposures. The system, method of interpreting the results and illustrative examples of experiments are presented and discussed. [Copyright &y& Elsevier]
- Published
- 2002
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