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In this paper, the characteristics of layered structures (photonic or electromagnetic bandgaps), including chiral media, are studied by means of two different numerical methods, one in the time domain (finite differences in the time domain, FDTD) and the other in the frequency domain (coupled-mode method, CMM). The results (reflection and transmission coefficients for a plane wave normally incident over a layered structure) obtained by means of both well different techniques are practically identical. Copyright © 2009 John Wiley & Sons, Ltd. [ABSTRACT FROM AUTHOR]

Schelkunoff's method, also commonly refered to as Coupled Mode Method (CMM), is a numerical method which gives the propagation constants and the electromagnetic field in a general homogeneous medium bounded by perfect electric walls. In this paper, we test Schelkunoff's method for a waveguide filled with an isotropic chiral material (chirowaveguide) where the dimensions of the walls are electrically large compared with the wavelength. It is reasonable to foresee that, in this case, the results given by Schelkunoff's method must approach to the corresponding ones for the chiral unbounded medium. Effectively, we obtain the solutions for both circular polarized waves (right-handed and left-handed) in free propagation in a single calculation. These results are in opposition with those of other authors analyzing analogous cases. [ABSTRACT FROM AUTHOR]

The TLM method, being a time domain method, cannot deal directly with frequency dispersive media. A way for modelling such media, for instance, dielectric dispersive ones, is proposed, starting from the causality relationship between field vectors D and E, which is discretized over the same space–time mesh as the three-dimensional TLM mesh (in our case, with HSCN node). This leads to adding, at each node on the network, three voltage sources (one for each field component), their value depending on the previous instants. The method is validated by computing the reflection (magnitude and phase) coefficient at normal incidence at an air–dielectric interface, for different dispersive behaviours of the dielectrics. Copyright © 2001 John Wiley & Sons, Ltd. [ABSTRACT FROM AUTHOR]