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The poor adhesion of common metals to CdZnTe (CZT)/CdTe surfaces has been a long-standing challenge for radiation detector applications. In this present work, we explored the use of an alternative electrode, viz., Al-doped ZnO (AZO) as a replacement to common metallic contacts. ZnO offers several advantages over the latter, such as having a higher hardness, a close match of the coefficients of thermal expansion for CZT and ZnO, and better adhesion to the surface of CZT due to the contact layer being an oxide. The AZO/CZT contact was investigated via high spatial-resolution X-ray response mapping for a planar detector at the micron level. The durability of the device was investigated by acquiring I-V measurements over an 18-month period, and good long-term stability was observed. We have demonstrated that the AZO/CZT/AZO virtual-Frisch-grid device performs fairly well, with comparable or better characteristics than that for the same detector fabricated with gold contacts. [ABSTRACT FROM AUTHOR]

In this work, we focused on investigating the various defects that extend into the near-surface region of CdZnTe (CZT) crystals, and on exploring processing techniques for producing a smooth, non-conductive surface that is ideal for growing thin films and depositing contacts. We determined the surface's features and the chemical species present using atomic-force microscopy, x-ray photoelectron spectroscopy, and scanning electron microscopy (SEM), coupled with energy-dispersive spectroscopy. We revealed crystallographic defects, e.g., sub-grains and dislocations on the CZT crystals' surfaces, after employing selected chemical etchants, and then characterized them using optical microscopy, SEM and optical profilometer. Our experimental data imply that the surface defects and chemical species induced by chemical processing may alter the material's interfacial behavior, and ultimately significantly influence the performance of radiation detectors. [ABSTRACT FROM AUTHOR]

Although CdZnTe (CZT) and CdMnTe (CMT) materials are leading contenders for room-temperature semiconductor detectors, nonetheless, both materials have limitations hindering their full usage in producing economical, uniform, large-volume devices due to their grain/twin boundaries, material purity, secondary-phase Te defects and material segregation. We tried to prevent the generation of twin and subgrain boundaries to achieve large-volume CZT crystals by means of local temperature control between the CZT melt and quartz crucible. Also, we have expanded the understanding of the electrical and structural properties of coherent/incoherent twin boundaries. The high residual impurities in the starting source materials, especially in manganese, were identified as obstacles against obtaining high-performance CMT detectors. We found that purifying manganese telluride (MnTe) via a floating Te melt-zone very effectively removes impurities, leading to better detectors. CMT detectors fabricated with purified material give a 2.1% energy resolution for 662 keV with a ^137Cs gamma source without any electron-loss corrections. Secondary-phase Te defects deteriorate detector performance due to incomplete charge collection caused by charge trapping. In situ growth interface studies reveal the thermo-migration of Te inclusions to CZT melts and the dependence of Te-inclusion size on the cooling rate. The effective segregation coefficient of Zn in the CdTe host is nearly 1.3, so about 5%–6% of Zn deviation was reported in Bridgman-grown CZT (Zn\,=10% ingots. Such uncontrolled Zn variations cause a significant variation of the band-gap throughout the ingot and, consequently, affect the nonuniformity of the detectors' responses. Practically, this means that manufacturers cannot cut the ingot parallel to the crystal growth direction. We also demonstrated that the segregation of Zn can be controlled by creating particular thermal environments after growth. [ABSTRACT FROM AUTHOR]

We studied, by current deep-level transient spectroscopy (I-DLTS), point defects induced in CdZnTe detectors by three dopants: Pb, Bi, and In. Pb-doped CdZnTe detectors have a new acceptor trap at around 0.48 eV. The absence of a V trap suggests that all Cd vacancies are compensated by Pb interstitials after they form a deep-acceptor complex [[Pb]-V]. Bi-doped CdZnTe detectors had two distinct traps: a shallow trap at around 36 meV and a deep donor trap at around 0.82 eV. In detectors doped with In, we noted three well-known traps: two acceptor levels at around 0.18 eV (A-centers) and 0.31 eV (V), and a deep trap at around 1.1 eV. [ABSTRACT FROM AUTHOR]

The behavior of the internal electric field of nuclear-radiation detectors substantially affects detector performance. We investigated the distribution of the internal field in cadmium zinc telluride (CZT) detectors under high carrier injection. We noted the build-up of a space-charge region near the cathode that produces a built-in field opposing the applied field. Its presence entails the collapse of the electric field in the rest of the detector, other than the portion near the cathode. Such a space-charge region originates from serious hole trapping in CZT. The device's operating temperature greatly affects the width of the space-charge region. With increasing temperature from 5°C to 35°C, its width expanded from about one-sixth to one-half of the total depth of the detector. [ABSTRACT FROM AUTHOR]

We evaluated the sub-pixel position resolution achievable in large-volume CdZnTe pixelated detectors with conventional pixel patterns and for several different pixel sizes: 2.8 mm, 1.72 mm, 1.4 mm and 0.8 mm. Achieving position resolution below the physical dimensions of pixels (sub-pixel resolution) is a practical path for making high-granularity position-sensitive detectors, <100 μ m, using a limited number of pixels dictated by the mechanical constraints and multi-channel readout electronics. High position sensitivity is important for improving the imaging capability of CZT gamma cameras. It also allows for making more accurate corrections of response non-uniformities caused by crystal defects, thus enabling use of standard-grade (unselected) and less expensive CZT crystals for producing large-volume position-sensitive CZT detectors feasible for many practical applications. We analyzed the digitized charge signals from a representative 9 pixels and the cathode, generated using a pulsed-laser light beam focused down to 10 μ m (650 nm) to scan over a selected 3 × 3 pixel area. We applied our digital pulse processing technique to the time-correlated signals captured from adjacent pixels to achieve and evaluate the capability for sub-pixel position resolution. As an example, we also demonstrated an application of 3D corrections to improve the energy resolution and positional information of the events for the tested detectors. [ABSTRACT FROM AUTHOR]

Abstract: We evaluated a spectroscopy-grade 15×15×7mm3 CdZnTe (CZT) crystal with a high μτ-product, >10−2 cm2/V, but impaired by microscopic extended defects, such as walls of dislocations, low-angle and sub-grain boundaries, and Te inclusions. First, we evaluated a planar detector fabricated from this crystal using a Micro-scale X-ray Detector Mapping (MXDM) technique. Then, we fabricated from the same crystal a pixel detector to study local non-uniformities of the electric field. The measured X-ray response maps confirmed the presence of non-uniformities in the charge transport, and they showed that the global- and local-distortions of the internal E-field correlated to the extended defects and space-charge buildup on the side surfaces. [Copyright &y& Elsevier]