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1. Combining moiré patterns and high resolution transmission electron microscopy for in-plane thin films thickness determination

2. Size and shape effects on the order–disorder phase transition in CoPt nanoparticles.

3. Confocal Raman and TEM measurements at the same area on nanoparticles

4. Comparing electron tomography and HRTEM slicing methods as tools to measure the thickness of nanoparticles

5. STEM nanodiffraction technique for structural analysis of CoPt nanoparticles

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