1. Secondary ion mass spectrometry to verify the implantation of magnetic ions in nanodiamonds.
- Author
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Lin, Bo-Rong, Wang, Chiung-Chi, Chen, Chien-Hsu, Kunuku, Srinivasu, Hsiao, Tung-Yuan, Yu, Hung-Kai, Chen, Tzung-Yuang, Chang, Yu-Jen, Liao, Li-Chuan, Chang, Chun-Hsiang, Chen, Fang-Hsin, Niu, Huan, and Lee, Chien-Ping
- Subjects
SECONDARY ion mass spectrometry ,NANODIAMONDS ,MAGNETIC ions ,ION implantation ,SILICON wafers ,IRON ions - Abstract
Ion implantation is used to create nanodiamonds (NDs) with embedded magnetic ions for use in a wide range of biological and medical applications; however, the effectiveness of this process depends heavily on separating magnetic NDs from nonmagnetic ones. In this study, we use secondary ion mass spectrometry to verify the implantation of magnetic ions in NDs and the success of separation. When applied to a series of NDs with embedded iron or manganese ions, the sorting tool used in this study proved highly effective in selecting magnetic NDs. Besides, multienergy ion implantation and precise thickness control of NDs coating on the silicon wafer were suggested to improve this technology. [ABSTRACT FROM AUTHOR]
- Published
- 2019
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