1. Direct Detection of Low Abundance Genes of Single Point Mutation
- Author
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Myungshin Kim, Sang-Hyun Song, Yonggoo Kim, Changill Ban, Hayoung Choi, Sourav Mishra, Joon Won Park, Tae-You Kim, Jinseong Jeon, and Jun-Kyu Kang
- Subjects
Atomic force microscopy ,Mechanical Engineering ,Point mutation ,Bioengineering ,General Chemistry ,Condensed Matter Physics ,medicine.disease_cause ,Sensitivity and Specificity ,Molecular biology ,Circulating Tumor DNA ,chemistry.chemical_compound ,chemistry ,Cell-free fetal DNA ,Duplex (building) ,Neoplasms ,Mutation ,Biomarkers, Tumor ,medicine ,Humans ,Point Mutation ,General Materials Science ,KRAS ,Gene ,Allele frequency ,DNA - Abstract
Cell-free DNA (cfDNA) analysis, specifically circulating tumor DNA (ctDNA) analysis, provides enormous opportunities for noninvasive early assessment of cancers. To date, PCR-based methods have led this field. However, the limited sensitivity/specificity of PCR-based methods necessitates the search for new methods. Here, we describe a direct approach to detect KRAS G12D mutated genes in clinical ctDNA samples with the utmost LOD and sensitivity/specificity. In this study, MutS protein was immobilized on the tip of an atomic force microscope (AFM), and the protein sensed the mismatched sites of the duplex formed between the capture probe on the surface and mutated DNA. A noteworthy LOD (3 copies, 0.006% allele frequency) was achieved, along with superb sensitivity/specificity (100%/100%). These observations demonstrate that force-based AFM, in combination with the protein found in nature and properly designed capture probes/blockers, represents an exciting new avenue for ctDNA analysis.
- Published
- 2021