1. Structure characteristics and microwave dielectric properties of Pr2(Zr1−xTix)3(MoO4)9 solid solution ceramic with a stable temperature coefficient.
- Author
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Tian, Huanrong, Zheng, Jinjie, Liu, Lintao, Wu, Haitao, Kimura, Hideo, Lu, Yizhong, and Yue, Zhenxing
- Subjects
DIELECTRIC properties ,CERAMICS ,SOLID solutions ,DIELECTRIC loss ,VALENCE bonds ,MICROWAVES - Abstract
· The sintering temperature of Pr 2 (Zr 1− x Ti x) 3 (MoO 4) 9 ceramic was below 900 °C. · Effect of bond characteristics on Pr 2 (Zr 1− x Ti x) 3 (MoO 4) 9 were discussed. · Excellent temperature stability was obtained (−14.1 ∼ −2.6 ppm/ °C). Pr 2 (Zr 1− x Ti x) 3 (MoO 4) 9 (x = 0.1–1.0) ceramics were prepared via a conventional solid-state method, the dependence of crystal structure and bond characteristics on microwave dielectric properties was investigated systemically. The X-ray diffraction patterns indicated that the single-phase Pr 2 Zr 3 (MoO 4) 9 structure was formed in all the specimens. As the Ti
4+ content increased, the lattice volume gradually decreased, which was ascribed to the fact that the ionic radius of Ti4+ was smaller than that of Zr4+ . Notably, outstanding microwave dielectric properties with ε r of 10.73–16.35, Q · f values of 80,696–18,726 GHz and minor τ f values −14.1 – −2.6 ppm/ °C were achieved in Pr 2 (Zr 1− x Ti x) 3 (MoO 4) 9 ceramics. The ε r increased with the rising x values, which was associated with the increase of α / V m values. The decreasing Q · f was affected by the decline of lattice energy of [Zr/TiO 6 ] octahedral. The τ f value was dominated by [Zr/TiO 6 ] octahedral distortion, Mo–O bond energy, bond strength and B-site bond valence. Furthermore, infrared reflection spectra suggested that the properties were mainly caused by the absorption of phonon, and the dielectric loss could be further reduced by optimizing the experimental process. [ABSTRACT FROM AUTHOR]- Published
- 2022
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