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Start Over Author "Musseau, Olivier" Topic metal oxide semiconductor field-effect transistors
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1. Total dose effects on a fully-depleted SOI NMOSFET and...

Author

Ferlet-Cavrois, Veronique and Musseau, Olivier

Subjects
*METAL oxide semiconductor field-effect transistors, *MATHEMATICAL models
Abstract

Discusses the mechanisms involved on the irradiation of a fully-depleted metal-oxide-semiconductor field-effect transistor (NMOSFET). Physical structure of the fully-depleted NMOS transistor; Study of an edgeless transistor and lateral parasitic transistor; Simulated subthreshold characteristics of transistors irradiated at 500krad silicon dioxide; Conclusion.

Published
1997
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