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We present analytical physics-based compact models for the Schottky barriers at the interfaces between the organic semiconductor and the source and drain contacts in organic thin-film transistors (TFTs) fabricated in the coplanar and the staggered device architecture, and we illustrate the effect of these Schottky barriers on the current–voltage characteristics of the TFTs. The model for the source barrier explicitly considers the field-dependent barrier lowering due to image charges. Potential solutions have been derived by applying the Schwarz–Christoffel transformation, leading to expressions for the electric field at the source barrier and for the contact resistance at the source contact. With regard to the drain barrier, a generic compact-modeling scheme based on the current–voltage characteristics of a barrier-less TFT is introduced that can be applied to any compact dc model. Finally, both models are incorporated into an existing charge-based compact dc model and verified against the results of measurements performed on coplanar and staggered organic TFTs with channel lengths ranging from 0.5 to $10.5~\mu \text{m}$. [ABSTRACT FROM AUTHOR]

In this work, short-channel effects (SCEs) in cylindrical gate-all-around (GAA) MOSFETs with intrinsic or lightly doped channels are analytically described by using the conformal mapping technique for 2-D double-gate (DG) FETs. An equivalent capacitor model leads to an equivalent channel length concept, which allows to correctly determine the SCEs relevant center and surface potentials (ΦC and ΦS) at the potential barrier. Furthermore, we make use of the rotational symmetry of GAA FETs and modify a compact drain current model of a DG device to use it for GAA transistors. Also, a mathematical correlation regarding quantum confinement for thin body transistors is derived, which shows that the mostly unwanted quantum effects occur in GAA structures already for thicker channels compared to DG transistors. Both transistor types experience a comparable influence with regard to quantization if the channel thickness of GAA FETs is 53% more than that of DG FETs. The dc behavior of our adapted model is verified with 3-D TCAD simulation data and applied to experimental data of ultrascaled silicon on insulator (SOI) omega-gate nanowire N-MOSFETs. [ABSTRACT FROM AUTHOR]

In this study, a consistent analytical charge-based model for the bias-dependent variability of the drain current of organic thin-film transistors is presented. The proposed model combines both charge-carrier-number-fluctuation effects and correlated-mobility-fluctuation effects to predict the drain-current variation and is verified using experimental data acquired from a statistical population of organic transistors with various channel dimensions, fabricated on flexible polymeric substrates in the coplanar or the staggered device architecture. [ABSTRACT FROM AUTHOR]

This article introduces analytical compact models of short-channel effects in staggered organic thin-film transistors (TFTs). The effects of subthreshold-swing degradation, threshold-voltage roll-off, and drain-induced barrier lowering (DIBL) on the static current-voltage characteristics of staggered TFTs are extracted from an analytical potential solution of the 2-D problem of the staggered geometry. This solution is derived by using the Schwarz–Christoffel transformation that leads to a complex mapping function linking the staggered geometry to an equivalent in another coordinate system for which an analytical potential solution exists. The technology CAD (TCAD) Software Sentaurus is used to verify the compact models. Finally, the closed-form and physics-based equations are incorporated into an existing compact current model and verified by measurements on staggered organic TFTs with channel lengths as small as 0.4 μm fabricated on flexible plastic substrates by stencil lithography. [ABSTRACT FROM AUTHOR]