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We demonstrate a method to enhance the atom loading rate of a ytterbium (Yb) magneto-optic trap (MOT) operating on the 556 nm ${^1S}_0 \rightarrow {^3P}_1$ intercombination transition (narrow linewidth $\Gamma_g = 2\pi \times 182$ kHz). Following traditional Zeeman slowing of an atomic beam near the 399 nm ${^1S}_0 \rightarrow {^1P}_1$ transition (broad linewidth $\Gamma_p = 2\pi \times 29 $ MHz), two laser beams in a crossed-beam geometry, frequency tuned near the same transition, provide additional slowing immediately prior to the MOT. Using this technique, we observe an improvement by a factor of 6 in the atom loading rate of a narrow-line Yb MOT. The relative simplicity and generality of this approach make it readily adoptable to other experiments involving narrow-line MOTs. We also present a numerical simulation of this two-stage slowing process which shows good agreement with the observed dependence on experimental parameters, and use it to assess potential improvements to the method.

We characterize a hybrid pixel direct detector and demonstrate its suitability for electron energy loss spectroscopy (EELS). The detector has a large dynamic range, narrow point spread function, detective quantum efficiency ≥ 0.8 even without single electron arrival discrimination, and it is resilient to radiation damage. It is capable of detecting ~5 × 106 electrons/pixel/second, allowing it to accommodate up to 0.8 pA per pixel and hence >100 pA EELS zero-loss peak (ZLP) without saturation, if the ZLP is spread over >125 pixels (in the non-dispersion direction). At the same time, it can reliably detect isolated single electrons in the high loss region of the spectrum. The detector uses a selectable threshold to exclude low energy events, and this results in essentially zero dark current and readout noise. Its maximum frame readout rate at 16-bit digitization is 2250 full frames per second, allowing for fast spectrum imaging. We show applications including EELS of boron nitride in which an unsaturated zero loss peak is recorded at the same time as inner shell loss edges, elemental mapping of an STO/BTO/LMSO multilayer, and efficient parallel acquisition of angle-resolved EEL spectra (S(q, ω)) of boron nitride.

Electron energy loss spectroscopy (EELS) in the electron microscope has progressed remarkably in the last five years. Advances in monochromator and spectrometer design have improved the energy resolution attainable in a scanning transmission electron microscope (STEM) to 4.2 meV, and new applications of ultrahigh energy resolution EELS have not lagged behind. They include vibrational spectroscopy in the electron microscope, a field that did not exist 5 years ago but has now grown very substantially. Notable examples include vibrational mapping with about 1 nm spatial resolution, analyzing the momentum dependence of vibrational states in very small volumes, determining the local temperature of the sample from the ratio of energy gains to energy losses, detecting hydrogen and analyzing its bonding, probing radiation-sensitive materials with minimized damage by aloof spectroscopy and leap-frog scanning, and identifying biological molecules with different isotopic substitutions. We review the instrumentation advances, provide a summary of key applications, and chart likely future directions.