1. Strain and damage build-up in irradiated crystals: Coupling X-ray diffraction with numerical simulations
- Author
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Thomas Jourdan, Alain Chartier, Alexandre Boulle, S. Pellegrino, Aurélien Debelle, Jean-Paul Crocombette, IRCER - Axe 3 : organisation structurale multiéchelle des matériaux (IRCER-AXE3), Institut de Recherche sur les CERamiques (IRCER), Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut des Procédés Appliqués aux Matériaux (IPAM), Université de Limoges (UNILIM)-Université de Limoges (UNILIM)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Service de la Corrosion et du Comportement des Matériaux dans leur Environnement (SCCME), Département de Physico-Chimie (DPC), CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay, Service de recherches de métallurgie physique (SRMP), Département des Matériaux pour le Nucléaire (DMN), Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM), and Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS)
- Subjects
Diffraction ,Nuclear and High Energy Physics ,Materials science ,business.industry ,[CHIM.MATE]Chemical Sciences/Material chemistry ,02 engineering and technology ,021001 nanoscience & nanotechnology ,01 natural sciences ,Molecular physics ,Atomic units ,Macroscopic scale ,0103 physical sciences ,Femtosecond ,X-ray crystallography ,Radiative transfer ,Radiation damage ,Microelectronics ,010306 general physics ,0210 nano-technology ,business ,[CHIM.RADIO]Chemical Sciences/Radiochemistry ,Instrumentation - Abstract
International audience; Radiation damage in materials is a space and time multi-scale process, ranging from the atomic scale up to the macroscopic scale, and from the femtosecond up to several years. The prediction of the long term evolution of materials subjected to radiative environments (in the nuclear or in the space industry, as well as in the field of microelectronics) therefore requires the combination of several simulation and experimental techniques able to cover the different space and time scales involved. X-ray diffraction (XRD) is highly sensitive to atomic displacements while probing macroscopic volumes of material. In this respect it is perfectly suited for the study of radiation damage. In this work it is shown how XRD can be quantitatively and qualitatively used in combination with numerical simulations, like molecular dynamics and rate-equation cluster dynamics, to analyze damage build-up in irradiated SiC and ZrC single crystals. Particular emphasis is laid on the methodological aspects of XRD data treatment in order to extract parameters such as damage-induced strain and disorder.
- Published
- 2019
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