1. On-Machine LTS Integration for Layer-Wise Surface Quality Characterization in MEX/P.
- Author
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Fernández, Alejandro, Zapico, Pablo, Blanco, David, Peña, Fernando, Beltrán, Natalia, and Mateos, Sabino
- Subjects
SURFACE analysis ,MANUFACTURING processes ,SURFACE texture ,SURFACE finishing ,QUALITY control ,DIGITIZATION - Abstract
Material Extrusion (MEX) currently stands as the most widespread Additive Manufacturing (AM) process, but part quality deficiencies remain a barrier to its generalized industrial adoption. Quality control in MEX is a complex task as extrusion performance impacts the consistency of mechanical properties and the surface finish, dimensional accuracy, and geometric precision of manufactured parts. Recognizing the need for early-stage process monitoring, this study explores the potential of integrating Laser Triangulation Sensors (LTS) into MEX/P manufacturing equipment for layer-wise 3D inspections. Using a double-bridge architecture, an LTS-based sub-micrometric inspection system operates independently from the manufacturing process, enabling comprehensive digitization and autonomous reconstruction of the target layer's topography. Surface texture is then computed using standardized indicators and a new approach that provides insight into layer quality uniformity. A case study evaluating two alternative extruder head designs demonstrates the efficacy of this integrated approach for layer quality characterization. Implementing a generalized layer-wise procedure based on this integration can significantly mitigate quality issues in MEX manufacturing and optimize process parameter configurations for enhanced performance. [ABSTRACT FROM AUTHOR]
- Published
- 2024
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