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Molybdenum doped vanadium oxide film on quartz and silicon substrates are grown by pulsed RF magnetron sputtering method. Surface morphology, phase analysis and oxide states are investigated by field emission scanning electron microscopy, X-ray diffraction and X-ray photoelectron spectroscopy techniques, respectively. Crystalline nature of the film deposited on both quartz and silicon are depicted. The transmittance and reflectance spectra recorded for the entire solar region. Further, optical constants viz. optical band gap and refractive index of the deposited films are estimated. Wavelength dependent low reflectance characteristic is observed for the deposited film on silicon. IR emittance (εIR) and sheet resistance (Rs) of the film are also evaluated. Copyright © 2017 John Wiley & Sons, Ltd. [ABSTRACT FROM AUTHOR]

Vanadium oxide films, deposited on aluminium (Al), titanium (Ti) and tantalum (Ta) metal substrates by pulsed RF magnetron sputtering at a working pressure of 1.5 x10−2 mbar at room temperature are found to display mixed crystalline vanadium oxide phases viz., VO2, V2O3, V2O5. The films have been characterized by field-emission scanning electron microscopy, X-ray diffraction, differential scanning calorimetry (DSC) and X-ray photoelectron spectroscopy, and their thermo-optical and electrical properties have been investigated. Studies of the deposited films by DSC have revealed a reversible-phase transition found in the temperature range of 45–49 °C. [ABSTRACT FROM AUTHOR]

Vanadium pentoxide (V 2 O 5 ) coatings on quartz and Si(111) substrates are grown by pulsed RF magnetron sputtering technique at constant RF power of 700 W at room temperature. Phase, microstructure and surface morphology are investigated by X-ray diffraction, field emission scanning electron microscopy and atomic force microscopy techniques, respectively. The transmittance and reflectance spectra are recorded for the solar region (200–2300 nm) of the spectral window. Further, optical constants viz. optical band gap, refractive index and extinction coefficient of the deposited V 2 O 5 coatings are estimated. Thickness dependent optical band gaps are found in the range of 2.78–2.59 eV. Wavelength dependent characteristic is also observed both for refractive index and extinction coefficient. Finally, thickness of the present coating predicted theoretically which is matched well with the thickness measured by direct measurement e.g., nanoprofilometry technique. [ABSTRACT FROM AUTHOR]