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The corrugated p-base (CB) structure has been acknowledged as an effective method to improve the maximum controllable current (MCC) of asymmetric integrated gate-commutated thyristor (IGCT), but never clarified in symmetrical devices such as reverse blocking IGCT (RB-IGCT). This study focuses on the influence of the CB structure on the MCC and the failure mechanism of RB-IGCT. First of all, by employing the CB structure in the RB-IGCT samples, it is verified that the CB structure can improve MCC of the symmetrical devices by more than 50%, no matter under high or low dc-link voltages. Moreover, regarding the scenario under the high dc-link voltage, the effect of the CB structure on the dynamic avalanche is analyzed via simulation, and the improvement of MCC and the positive trend of MCC upon temperature are further clarified. As to the scenario under the low dc-link voltage, distinct failure phenomenon and negative temperature dependence of MCC are observed evidentially on the symmetric devices with CB structure. To explain these failure characteristics that are conflicting with the well-acknowledged dynamic avalanche failure, a novel failure mode named cathode retrigger failure is proposed in this study. It is believed that this study not only deciphers the fundamental mechanisms of the CB structure in RB-IGCT, but also provides practical strategy to optimize the symmetric IGCT devices. [ABSTRACT FROM AUTHOR]

Compared with integrated gate commutated thyristors (GCTs), an integrated emitter turn-off thyristor (IETO) has a potential of higher turn-off current capability and requires lower power consumption for gate driver units, which is more suitable for high-power applications. Thus, in this article, an advanced design of 4-in IETO was presented. To reduce the gate commutation impedance and enhance the turn-off current, the turn-off circuit with low impedance DirectFETs was integrated into the housing. And the housing structure was carefully designed to provide a compact current commutation path. Then, a 4-in IETO prototype based on a 4.5 kV/5 kA GCT wafer was developed. Experimental results show that its maximum turn-off current was over 8.1 kA with an extremely short commutation time of 130 ns. And the total commutation inductance was only 0.38 nH. Additionally, the thermal and mechanical characteristics of the housing were also taken into consideration during design and verified by the thermal simulation and mechanical stress test. Consequently, according to this article, IETO has the potential to be a competitive device in high-power applications in the near future. [ABSTRACT FROM AUTHOR]

The turn-off capability test for the single cell of power devices is of great significance to both the safe operation assurance and the destruction mechanism research. However, with present techniques, the device under test is supposed to be destroyed once the turn-off fault occurs. In this article, a robust nondestructive test scheme based on the multistage anode voltage detection for 4500 V single-cell turn-off capability of press-packed devices is proposed. Based on the proposed scheme, a single cell of IGCT is tested until a fault occurs. The result proves that a total bypass time is less than 100 ns for the 2200 V/5 A turn-off fault, and thus, the aim of nondestructive tests can be achieved with the proposed method. [ABSTRACT FROM AUTHOR]

Turn-off capability of integrated gate-commutated thyristor is highly dependent on the commutation capability of its gate driver unit (GDU). To enhance it, stray impedance is the crucial limitation, which has not been obtained accurately before. Thus, in this paper, acquisition method of impedance based on experimental measurements was carefully analyzed, including electrolytic and ceramic capacitors, mosfets, printed circuit board, and GCT housing. And each part of stray impedance was obtained based on a series of experiments with 6-inch GCTs and two types of conventional GDUs. To further enhance commutation speed, an improved GDU was developed, reducing the total stray inductance from 0.395 to 0.037 nH, stray resistance from 0.444 to 0.227 mΩ. An extremely high current of 12.5 kA was successfully turned off, which is the maximum turn-off current level so far. Besides, the maximum commutation capability was tested as over 17 kA. Consequently, no further optimization of GDU is necessary. However, there was still about 1.0 nH existing inside the GCT housing we used. A novel housing with lower stray inductance is expected for higher commutation speed in the future. [ABSTRACT FROM AUTHOR]

DC circuit breakers (DCBs) are crucial components in dc power systems. The ultralow operating frequency of the DCBs enables the use of gate-commutated thyristors (GCTs) in the DCBs. This paper proposed a 6-in dual-gate ring commutated thyristor (DGRCT) for the DCB applications. The wafer and package designs of the DGRCT are first presented and discussed, analyzing the principles of the current commutation in the DGRCTs. Subsequently, a DGRCT prototype is fabricated, and experiments are conducted to measure the inductance along the current commutation loop (CCL) of the prototype DGRCT. Finally, a large current interruption experiment is conducted. The results show that the prototype DGRCT reduced the parasitic inductance within the CCL by at least 20% compared to conventional GCTs with single-gate ring design. The maximum current interruption capacity of the prototype DGRCT is no less than 12 kA at T = 300 K, which approaches the fault current interruption requirement in DCB applications for both transmission and distribution levels of dc power systems. [ABSTRACT FROM AUTHOR]