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X-ray free-electron lasers (XFELs) provide intense (∼1012 photons per pulse) coherent X-rays with ultra-short (∼10−14 s) pulse lengths. X-rays of such an unprecedented nature have introduced new means of atomic scale structural investigations, and discoveries are still ongoing. Effective use of XFELs would be further accelerated on a highly adaptable platform where most of the new experiments can be realized. Introduced here is the multiple-application X-ray imaging chamber (MAXIC), which is able to carry out various single-pulse diffraction experiments including single-shot imaging, nanocrystallographic data acquisition and ultra-fast pump–probe scattering for specimens in solid, liquid and gas phases. The MAXIC established at the SPring-8 ångström compact free-electron laser (SACLA) has demonstrated successful applications in the aforementioned experiments, but is not limited to them. Also introduced are recent experiments on single-shot diffraction imaging of Au nanoparticles and serial crystallographic data collection of lysozyme crystals at SACLA.

Single-shot imaging using femtosecond x-ray pulses from x-ray free electron lasers (XFELs) has revealed high-resolution structures of Au nanoparticles and biological macromolecular complexes. The x-ray pulse power of 10 GW is enough to vaporize specimen when it is focused on a few microns area. This makes it essential to have a single particle loader to provide fresh samples to the x-ray pulses. In this paper we introduce single-shot imaging at Spring-8 Angstrom Compact Free Electron Laser (SACLA) to investigate various types of specimen, from metallic nanoparticles to biological macromolecules, prepared on Si3N4 membrane. A significant reduction in sample consumption is achieved while maintaining a data acquisition rate of 30 Hz, which is compatible with the current SACLA operation rate.

An automated spectrofluorometer system utilizing an on-line minicomputer is described. This system primarily consists of a commercial spectrofluorometer, a minicomputer and simple peripherals. Attractive features of this system lie in the fact that the rapid collection of the absolute spectra is carried out by using correction factors derived from the results of absolute intensity measurement by means of a quantum counter. During the standardization process for the spectral correction, two individual monochromators in the instrument can be precisely synchronized like a double-monochromator with the assistance of the computer. Details of the system are presented with the results of its performance test.